Prof. Joan Bausells Profile

Prof. Joan Bausells

Research Professor at Ctr Nacional de Microelectrónica

SPIE Involvement:

Author

Area of Expertise:

MEMS , Nanofabrication , ISFET , NEMS , CMOS sensors , Nanomechanics

Publications (5)

Proceedings Article | 13 June 2017 Presentation + Paper

Development of biosensors for non-invasive measurements of heart failure biomarkers in saliva

Albert Alcacer, Angelos Streklas, Abdoullatif Baraket, Nadia Zine, Abdelhamid Errachid, Joan Bausells

Proceedings Volume 10246, 102460H (2017) https://doi.org/10.1117/12.2266363

KEYWORDS: Biosensors, Gold, Electrodes, Heart, Silver, Silicon, Sensors, Platinum, Lithography

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SPIE Journal Paper | 27 July 2015

Fabrication of functional electromechanical nanowire resonators by focused ion beam implantation

Jordi Llobet, Marta Gerbolés, Marc Sansa, Joan Bausells, Xavier Borrisé, Francesc Pérez-Murano

JM3, Vol. 14, Issue 03, 031207, (July 2015) https://doi.org/10.1117/12.10.1117/1.JMM.14.3.031207

KEYWORDS: Silicon, Scanning electron microscopy, Wet etching, Ion beams, Ion implantation, Resonators, Etching, Nanolithography, Ions, Nanowires

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Proceedings Article | 10 April 2000 Paper

Dynamic checking improves MEMS design methodology

Xavi Marin, Jordi Carrabina, Joan Bausells

Proceedings Volume 4019, (2000) https://doi.org/10.1117/12.382310

KEYWORDS: Etching, Microelectromechanical systems, Manufacturing, Tolerancing, Semiconducting wafers, Finite element methods, Standards development, Yield improvement, Electronic design automation, Transistors

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Proceedings Article | 23 September 1996 Paper

Approach for semicustom integrated-sensor system manufacturing in a commercial CMOS technology

Joan Bausells

Proceedings Volume 2879, (1996) https://doi.org/10.1117/12.251220

KEYWORDS: Sensors, Silicon, Standards development, Manufacturing, System integration, Infrared sensors, Computer aided design, CMOS technology, Field effect transistors, Anisotropic etching

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Proceedings Article | 17 September 1996 Paper

Industrial microsystems on top of CMOS design and process

Jordi Carrabina, Joaquin Saiz, David Marin, Xavier Marin, Angel Merlos, Joan Bausells

Proceedings Volume 2882, (1996) https://doi.org/10.1117/12.250717

KEYWORDS: Computer aided design, Microsystems, Sensors, CMOS sensors, Standards development, Etching, CMOS technology, Sensor technology, Solid modeling, Instrument modeling

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Conference Committee Involvement (8)

Smart Sensors, Actuators, and MEMS VIII

8 May 2017 | Barcelona, Spain

Smart Sensors, Actuators, and MEMS VII

4 May 2015 | Barcelona, Spain

Smart Sensors, Actuators, and MEMS VI

24 April 2013 | Grenoble, France

Smart Sensors, Actuators and MEMS

18 April 2011 | Prague, Czech Republic

Smart Sensors, Actuators and MEMS

4 May 2009 | Dresden, Germany

Showing 5 of 8 Conference Committees

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