Joel Bahena
at Veeco Instruments Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 October 2022 Poster
Katrina Rook, Ashish Kulkarni, Antonio Checco, Kenji Yamamoto, Russell Luberoff, Mario Roque, Stephen Lozowski, Joel Bahena, Marjorie Chee, Meng Lee
Proceedings Volume PC12292, PC122920X (2022) https://doi.org/10.1117/12.2641798
KEYWORDS: Extreme ultraviolet, High volume manufacturing, Ions, Ion beams, Silicon, Reflectivity, Photomasks, Motion controllers, Molybdenum, Manufacturing

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