Dr. Joelle Oiknine-Schlesinger Profile

Dr. Joelle Oiknine-Schlesinger

V.P. R&D at Opgal Optronic Industries Ltd

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Publications (9)

Proceedings Article | 7 May 2009 Paper

High resolution 1280×1024, 15 µm pitch compact InSb IR detector with on-chip ADC

O. Nesher, I. Pivnik, E. Ilan, Z. Calalhorra, A. Koifman, I. Vaserman, J. Oiknine Schlesinger, R. Gazit, I. Hirsh

Proceedings Volume 7298, 72983K (2009) https://doi.org/10.1117/12.817054

KEYWORDS: Sensors, Readout integrated circuits, Single crystal X-ray diffraction, Signal processing, Staring arrays, CMOS technology, Infrared detectors, Image resolution, Analog electronics, Signal detection

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Over the last decade, SCD has developed and manufactured high quality InSb Focal Plane Arrays (FPAs), which are currently used in many applications worldwide. SCD's production line includes many different types of InSb FPA with formats of 320x256, 480x384 and 640x512 elements and with pitch sizes in the range of 15 to 30 μm. All these FPAs are available in various packaging configurations, including fully integrated Detector-Dewar-Cooler Assemblies (DDCA) with either closed-cycle Sterling or open-loop Joule-Thomson coolers. With an increasing need for higher resolution, SCD has recently developed a new large format 2-D InSb detector with 1280x1024 elements and a pixel size of 15μm. The InSb 15μm pixel technology has already been proven at SCD with the "Pelican" detector (640x512 elements), which was introduced at the Orlando conference in 2006. A new signal processor was developed at SCD for use in this mega-pixel detector. This Readout Integrated Circuit (ROIC) is designed for, and manufactured with, 0.18 μm CMOS technology. The migration from 0.5 to 0.18 μm CMOS technology supports SCD's roadmap for the reduction of pixel size and power consumption and is in line with the increasing demand for improved performance and on-chip functionality. Consequently, the new ROIC maintains the same level of performance and functionality with a 15 μm pitch, as exists in our 20 μm-pitch ROICs based on 0.5μm CMOS technology. Similar to Sebastian (SCD ROIC with A/D on chip), this signal processor also includes A/D converters on the chip and demonstrates the same level of performance, but with reduced power consumption. The pixel readout rate has been increased up to 160 MHz in order to support a high frame rate, resulting in 120 Hz operation with a window of 1024×1024 elements at ~130 mW. These A/D converters on chip save the need for using 16 A/D channels on board (in the case of an analog ROIC) which would operate at 10 MHz and consume about 8Watts A Dewar has been designed with a stiffened detector support to withstand harsh environmental conditions with a minimal contribution to the heat load of the detector. The combination of the 0.18μm-based low power CMOS technology for the ROIC and the stiffening of the detector support within the Dewar has enabled the use of the Ricor K508 cryo-cooler (0.5 W). This has created a high-resolution detector in a very compact package. In this paper we present the basic concept of the new detector. We will describe its construction and will present electrical and radiometric characterization results.

Proceedings Article | 7 May 2009 Paper

Progress with antimonide-based detectors at SCD

Olga Klin, Steve Grossman, Noam Snapi, Maya Brumer, Inna Lukomsky, Michael Yassen, Boris Yofis, Alex Glozman, Ami Zemel, Tal Fishman, Eyal Berkowicz, Osnat Magen, Joelle Oiknine-Schlesinger, Itay Shtrichman, Eliezer Weiss, P. Klipstein

Proceedings Volume 7298, 72980G (2009) https://doi.org/10.1117/12.822429

KEYWORDS: Diffusion, Superlattices, Sensors, Diodes, Temperature metrology, Gallium antimonide, Semiconducting wafers, Single crystal X-ray diffraction, Luminescence, Doping

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Proceedings Article | 14 May 2007 Paper

Pelican: SCD's 640 × 512/15 µm pitch InSb detector

J. Oiknine Schlesinger, Z. Calahorra, E. Uri, O. Shick, T. Fishman, I. Shtrichman, E. Sinbar, V. Nahum, E. Kahanov, B. Shlomovich, S. Hasson, N. Fishler, D. Chen, T. Markovitz

Proceedings Volume 6542, 654231 (2007) https://doi.org/10.1117/12.720520

KEYWORDS: Staring arrays, Sensors, Single crystal X-ray diffraction, Image quality, Image quality standards, Readout integrated circuits, Modulation transfer functions, Nonuniformity corrections, Standards development, Manufacturing

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Proceedings Article | 17 May 2006 Paper

High performance InAlSb MWIR detectors operating at 100K and beyond

Alex Glozman, Eli Harush, Eli Jacobsohn, Olga Klin, Philip Klipstein, Tuvy Markovitz, Vered Nahum, Erez Saguy, Joelle Oiknine-Schlesinger, Itay Shtrichman, Michael Yassen, Boris Yofis, Eliezer Weiss

Proceedings Volume 6206, 62060M (2006) https://doi.org/10.1117/12.667783

KEYWORDS: Sensors, Staring arrays, Signal processing, Single crystal X-ray diffraction, Aluminum, Diodes, Digital signal processing, Missiles, Temperature metrology, Argon

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Proceedings Article | 6 December 2004 Paper

Third-generation infrared detector program at SCD: InAlSb focal plane arrays

Philip Klipstein, Zipora Calahorra, Ami Zemel, Rafi Gatt, Eli Harush, Eli Jacobsohn, Olga Klin, Michael Yassen, Joelle Oiknine-Schlesinger, Eliezer Weiss

Proceedings Volume 5612, (2004) https://doi.org/10.1117/12.580462

KEYWORDS: Single crystal X-ray diffraction, Staring arrays, Infrared detectors, Infrared technology, Diodes, Nonuniformity corrections, Electro optics, Infrared imaging, Infrared radiation, Electro optical systems

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Proceedings Article | 30 August 2004 Paper

Third-generation infrared detector program at SCD

Philip Klipstein, Zipora Calahorra, Ami Zemel, Rafi Gatt, Eli Harush, Eli Jacobsohn, Olga Klin, Michael Yassen, Joelle Oiknine-Schlesinger, Eliezer Weiss, Salomon Risemberg

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.548413

KEYWORDS: Single crystal X-ray diffraction, Antimony, Infrared detectors, Lithium, Laser Doppler velocimetry, Aluminum, Nonuniformity corrections, Infrared technology, Quantum wells, Compound semiconductors

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Proceedings Article | 10 October 2003 Paper

Digital cooled InSb detector for IR detection

Ofer Nesher, Shimon Elkind, Amnon Adin, Itsik Nevo, A. Yaakov, S. Raichshtain, Arcadi Marhasev, A. Magner, M. Katz, T. Markovitz, Dan Chen, M. Kenan, A. Ganany, J. Oiknine Schlesinger, Z. Calahorra

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.498154

KEYWORDS: Sensors, Signal processing, Signal detection, Digital signal processing, Field programmable gate arrays, Single crystal X-ray diffraction, Analog electronics, Interference (communication), Infrared sensors, Staring arrays

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Proceedings Article | 23 January 2003 Paper

Performance of BF focal plane array 320x256 InSb detectors

Orna Nesher, Shimon Elkind, Amnon Adin, U. Palty, Oshri Pelleg, Eli Jacobsohn, T. Markovitz, Igor Szafranek, Zipora Calahora, J. Oiknine Schlesinger

Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.451313

KEYWORDS: Staring arrays, Sensors, Signal processing, Cadmium sulfide, Single crystal X-ray diffraction, Temperature metrology, Nonuniformity corrections, Capacitors, Curium, Video

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Proceedings Article | 17 July 2000 Paper

Temperature dependence of spatial noise in InSb focal plane arrays

Lior Shkedy, Ornit Amir, Zipora Calahora, Joelle Oiknine-Schlesinger, Igor Szafranek

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391762

KEYWORDS: Staring arrays, Nonuniformity corrections, Sensors, Temperature metrology, Calibration, Black bodies, Detection and tracking algorithms, Digital signal processing, Single crystal X-ray diffraction, Signal detection

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Showing 5 of 9 publications

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