Dr. John G. Jones Profile

Dr. John G. Jones

Research Engineer at Air Force Research Lab

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Author

Publications (11)

Proceedings Article | 4 October 2024 Presentation

Automated nanoscale multi-layer optical materials growth with reactive magnetron sputtering and in situ ellipsometry

John Jones, Peter Stevenson, Maggie Lankford, Cynthia Bowers, Lirong Sun, Joseph Garbarino, Lyuba Kuznetsova

Proceedings Volume PC13116, PC1311602 (2024) https://doi.org/10.1117/12.3025638

KEYWORDS: Sputter deposition, Magnetrons, Ellipsometry, Refractive index, Optical properties, Materials properties, Hyperbolic metamaterials, Vacuum, Spectroscopic ellipsometry, Silicon

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Proceedings Article | 3 October 2024 Presentation

Impact of epsilon-near-zero multilayer composition on simultaneous difference frequency and second harmonic generation

Ekaterina Poutrina, Mahalingam Krishnamurthy, Cynthia Bowers, Chintalapalle Ramana, Robert Bedford, John Jones

Proceedings Volume PC13110, PC131101P (2024) https://doi.org/10.1117/12.3038366

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Proceedings Article | 4 March 2022 Presentation + Paper

Efficient optimization of nonlinear optical devices with ITO/SiO2 layered hyperbolic metamaterials

James Ethridge, John Jones, Manuel Ferdinandus, Michael Havrilla, Michael Marciniak

Proceedings Volume 11997, 1199707 (2022) https://doi.org/10.1117/12.2610660

KEYWORDS: Metamaterials, Metals, Switching, Dielectrics, Systems modeling, Refraction, Optical switching, Dielectric polarization, Optimization (mathematics), Absorption

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Proceedings Article | 3 August 2021 Presentation + Paper

Linear and nonlinear properties of ITO/SiO2 layered metamaterials

James Ethridge, John Jones, Manuel Ferdinandus, Michael Havrilla, Michael Marciniak

Proceedings Volume 11796, 117960U (2021) https://doi.org/10.1117/12.2594599

KEYWORDS: Metamaterials, Metals, Data modeling, Optical properties, Transmission electron microscopy, Ellipsometry, Nonlinear optics, Dielectrics

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SPIE Journal Paper | 20 April 2017

Al₂O₃−BaTiO₃ nanolaminates fabricated by multistationary target pulsed laser deposition with in situ ellipsometry

John Jones, John Boeckl, Steven Smith, Gerald Landis, Neil Murphy, Zhongqiang Hu, Cynthia Bowers, Charles Stutz

JNP, Vol. 11, Issue 04, 043506, (April 2017) https://doi.org/10.1117/12.10.1117/1.JNP.11.043506

KEYWORDS: Aluminum, Thin films, Ellipsometry, Nanolithography, Pulsed laser operation, Pulsed laser deposition, Transmission electron microscopy, Oxides, Capacitance, Silicon

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Proceedings Article | 5 October 2015 Presentation

Optical and structural properties of co-sputtered Cu-Si-O and Cu-Ge-O thin films (Presentation Recording)

Lirong Sun, Neil Murphy, John Jones, John Grant

Proceedings Volume 9556, 955605 (2015) https://doi.org/10.1117/12.2188902

KEYWORDS: Thin films, Oxides, Copper, Silicon, Germanium, Refractive index, Ellipsometry, Reflectance spectroscopy, Modulation, Sputter deposition

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SPIE Journal Paper | 5 August 2015

Tunable stoichiometry of SiOx-BaTiOy-BOz fabricated by multitarget pulsed laser deposition

John Jones, Jonathan Goldstein, Steven Smith, Gerald Landis, Lawrence Grazulis, Neil Murphy, Gregory Kozlowski, Rachel Jakubiak, Charles Stutz, Lirong Sun

JNP, Vol. 9, Issue 01, 093590, (August 2015) https://doi.org/10.1117/12.10.1117/1.JNP.9.093590

KEYWORDS: Silicon, Ellipsometry, Thin films, Data modeling, Molybdenum, Oxides, Capacitance, Excimer lasers, Glasses, Oxygen

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Proceedings Article | 18 September 2014 Paper

Germanium devices for integrated photonic circuits

F. Hopkins, Alexander Benken, Kevin Walsh, John Jones, Kent Averett

Proceedings Volume 9226, 92260I (2014) https://doi.org/10.1117/12.2061080

KEYWORDS: Germanium, Etching, Photonic integrated circuits, Silicon, Integrated photonics, Crystals, Integrated circuit design, Integrated circuits, Sensors, Photonics

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SPIE Journal Paper | 14 February 2014 Open Access

Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry

John Jones, Lirong Sun, Neil Murphy, Tyson Back, Matthew Lange, Jessica Remmert, Paul Murray

JNP, Vol. 8, Issue 01, 089999, (February 2014) https://doi.org/10.1117/12.10.1117/1.JNP.8.089999

KEYWORDS: Thin films, Pulsed laser deposition, Ellipsometry, Sun, Roads, Metamaterials, Photonic nanostructures, Nanostructured thin films, Analytical research, Information technology

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SPIE Journal Paper | 5 February 2014

Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry

John Jones, Lirong Sun, Neil Murphy, Tyson Back, Matthew Lange, Jessica Remmert, P. Terrance Murray, Rachel Jakubiak

JNP, Vol. 8, Issue 01, 083999, (February 2014) https://doi.org/10.1117/12.10.1117/1.JNP.8.083999

KEYWORDS: Thin films, Carbon, Ellipsometry, Data modeling, Pulsed laser operation, Pulsed laser deposition, Raman spectroscopy, Atomic force microscopy, Tunable lasers, Silicon

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Proceedings Article | 24 September 2013 Paper

Germanium on silicon to enable integrated photonic circuits

F. Kenneth Hopkins, Kevin Walsh, Alexander Benken, John Jones, Kent Averett, Darnell Diggs, Loon-Seng Tan, Shin Mou, James Grote

Proceedings Volume 8876, 88760X (2013) https://doi.org/10.1117/12.2025186

KEYWORDS: Germanium, Silicon, Etching, Integrated photonics, Semiconductor lasers, Photodetectors, Photonic integrated circuits, Integrated circuit design, Integrated circuits, Sensors

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Showing 5 of 11 publications

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