John L. Vampola
Systems Engineer at RTX Corp
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 27 July 2016 Paper
Barry Starr, Lynn Mears, Chad Fulk, Jonathan Getty, Eric Beuville, Raymond Boe, Christopher Tracy, Elizabeth Corrales, Sean Kilcoyne, John Vampola, John Drab, Richard Peralta, Christy Doyle
Proceedings Volume 9915, 99152X (2016) https://doi.org/10.1117/12.2233033
KEYWORDS: Astronomy, Mercury cadmium telluride, Infrared radiation, Infrared detectors, Sensors, Silicon, Infrared radiation, Sensors, Infrared detectors, Readout integrated circuits, Modulation transfer functions, Quantum efficiency, Semiconducting wafers

Proceedings Article | 29 September 2014 Paper
S. Kilcoyne, N. Malone, B. Kean, J. Cantrell, J. Fierro, L. Meier, S. DeWalt, C. Hewitt, J. Wyles, J. Drab, G. Grama, G. Paloczi, J. Vampola, K. Brown
Proceedings Volume 9219, 921906 (2014) https://doi.org/10.1117/12.2072720
KEYWORDS: Sensors, Semiconducting wafers, Readout integrated circuits, Modulation transfer functions, Wafer bonding, Quantum efficiency, Silicon, Interfaces, Image processing, Staring arrays

Proceedings Article | 12 September 2014 Paper
Craig Adams, Neil Malone, Raymond Torres, Armando Fajardo, John Vampola, William Drechsler, Russell Parlato, Christopher Cobb, Max Randolph, Surath Chiourn, Robert Swinehart
Proceedings Volume 9219, 92190A (2014) https://doi.org/10.1117/12.2065901
KEYWORDS: Metals, Scanning electron microscopy, Gold, Electron microscopes, Beryllium, Data modeling, Circuit switching, Device simulation, Instrument modeling, Inspection

Proceedings Article | 24 October 2012 Paper
Proceedings Volume 8511, 851111 (2012) https://doi.org/10.1117/12.964392
KEYWORDS: Sensors, Readout integrated circuits, Modulation transfer functions, Staring arrays, Electronics, Image sensors, Quantum efficiency, Imaging systems, Interfaces, Silicon

Proceedings Article | 17 September 2011 Paper
Decosta Lindsay, James Bangs, John Vampola, Frank Jaworski, Lynn Mears, Rich Wyles, James Asbrock, Elyse Norton, Madhu Reddy, Kimon Rybnicek, Alan Levy, Neil Malone
Proceedings Volume 8154, 81540S (2011) https://doi.org/10.1117/12.898349
KEYWORDS: Semiconducting wafers, Sensors, Staring arrays, Silicon, Readout integrated circuits, Infrared radiation, Mercury cadmium telluride, Mid-IR, Quantum efficiency, Infrared detectors

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top