Dr. Jorge Piris
Optoelectronics Engineer at European Space Research and Technology Ctr
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 12 July 2023 Open Access Paper
Vidmantas Tomkus, Julijanas Zeludevicius, Gustas Liaugminas, Mohsen Razavi, Osama Elmabrok, Laurynas Maciulis, Martynas Milasevicius, Jorge Piris, Gediminas Raciukaitis
Proceedings Volume 12777, 127775T (2023) https://doi.org/10.1117/12.2691094
KEYWORDS: Photons, Pulse signals, Fiber amplifiers, Optical filters, Tunable filters, Single photon detectors, Pulse generators, Optical fibers, Signal detection, Astronomical imaging

Proceedings Article | 12 July 2023 Open Access Paper
Sebastian Ecker, Johannes Pseiner, Jorge Piris, Martin Bohmann
Proceedings Volume 12777, 1277727 (2023) https://doi.org/10.1117/12.2689972
KEYWORDS: Photons, Quantum entanglement, Satellites, Entanglement based quantum key distribution, Quantum key distribution, Quantum repeaters, Quantum networks, Adaptive optics, Quantum protocols, Quantum systems

Proceedings Article | 12 July 2023 Open Access Paper
Daniel Rieländer, Andrea Di Mira, David Alaluf, Robert Daddato, Sinda Mejri, Jorge Piris, Jorge Alves, Dimitrios Antsos, Abhijit Biswas, Nikos Karafolas, Klaus-Jürgen Schulz, Clemens Heese
Proceedings Volume 12777, 127770E (2023) https://doi.org/10.1117/12.2688805
KEYWORDS: Transmitters, Space operations, Telescopes, Signal detection, Receivers, Beam diameter, Optical communications, Laser safety, Laser systems engineering, Modulation

Proceedings Article | 12 July 2023 Open Access Paper
Jean-Marc Merolla, Benjamin Pages, Johann Cussey, Romain Martinenghi, Valentin Parra, Emmanuel Fretel, Jérôme Prieur, Jorge Piris
Proceedings Volume 12777, 1277725 (2023) https://doi.org/10.1117/12.2689969
KEYWORDS: Quantum entanglement, Satellites, Entanglement based quantum key distribution, Signal attenuation, Quantum key distribution, Astronomical imaging, Signal processing, Satellite communications, Quantum networks, Quantum communication protocols

Proceedings Article | 17 November 2017 Open Access Paper
C. Hagen, M. Ellmeier, J. Piris, R. Lammegger, I. Jernej, W. Magnes, E. Murphy, A. Pollinger, C. Erd, W. Baumjohann
Proceedings Volume 10563, 105634Y (2017) https://doi.org/10.1117/12.2304073
KEYWORDS: Vertical cavity surface emitting lasers, Sensors, Manufacturing, Diodes, Magnetometers, Semiconductor lasers, Optics manufacturing, Polarization, Laser manufacturing, Astronomical imaging

Proceedings Article | 17 November 2017 Open Access Paper
J. Piris, E. Murphy, M. Levy, G. Klumel, R. Diamant, B. Sarti
Proceedings Volume 10563, 105633A (2017) https://doi.org/10.1117/12.2304202
KEYWORDS: Semiconductor lasers, High power lasers, Diodes, Astronomical imaging, Space operations, Nitrogen, Oxygen, Contamination, Single crystal X-ray diffraction, Reliability

Proceedings Article | 6 December 2016 Paper
H. Schroeder, M. Hippler, P. Allenspacher, W. Riede, A. Ciapponi, A. Mateo, T. Ivanov, J. Alves, J. Piris, C. Heese, D. Wernham
Proceedings Volume 10014, 100141K (2016) https://doi.org/10.1117/12.2244507
KEYWORDS: Laser ablation, Ceramics, Laser damage threshold, Particles, Aluminum, Scanning electron microscopy, Silicon carbide, Inspection, Copper, Microscopy

Proceedings Article | 4 November 2014 Paper
C. Heese, A. Ciapponi, J. Piris, T. Ivanov, P. Allenspacher, M. Lammers, H. Schröder, W. Riede
Proceedings Volume 9237, 923719 (2014) https://doi.org/10.1117/12.2066847
KEYWORDS: Laser damage threshold, Laser induced damage, Silicon, Semiconducting wafers, Data acquisition, Diodes, Damage detection, Optical testing, Nd:YAG lasers, Aerospace engineering

Proceedings Article | 14 November 2013 Paper
Stefan Schrameyer, Heinrich Mädebach, Lars Jensen, Detlev Ristau, Clemens Heese, Jorge Piris, Alessandra Ciapponi, Bruno Sarti, Paul Allenspacher, Melanie Lammers, Wolfgang Riede, Andrius Melninkaitis, Gintarė Batavičiūtė, Linas Smalakys, Valdas Sirutkaitis
Proceedings Volume 8885, 88850F (2013) https://doi.org/10.1117/12.2030098
KEYWORDS: Coating, Antireflective coatings, Standards development, Error analysis, Mirrors, Laser damage threshold, Laser induced damage, Optical testing, Data modeling, Laser sources

Showing 5 of 9 publications
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