Prof. Josep Pladellorens Profile

Prof. Josep Pladellorens

CeU at Univ Politècnica de Catalunya

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 17 July 2014 Open Access

Optical inspection methods and their applications in the manufactured industrial sector: knowledge transfer to Panamanian industry

Abdiel Pino, Josep Pladellorens

Proceedings Volume 9289, 928927 (2014) https://doi.org/10.1117/12.2070724

KEYWORDS: Optical inspection, Optics manufacturing, Image processing, Speckle pattern, Digital image processing, Precision optics, Applied research, Optical metrology, Speckle, Analytical research

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Proceedings Article | 18 November 2013 Paper

Measurement of the roughness surface of the specials papers using the normalized autocorrelation function of the fields of the texture of speckle pattern

Abdiel Pino, Josep Pladellorens

Proceedings Volume 8785, 87851G (2013) https://doi.org/10.1117/12.2027555

KEYWORDS: Speckle pattern, Surface roughness, Confocal microscopy, Speckle, Microscopes, Radium, Scattering, Matrices, Fourier transforms, Cameras

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Proceedings Article | 11 September 2012 Paper

Measurement of the roughness surface using the normalized autocorrelation function of the fields of the texture of speckle pattern

Abdiel Pino, Josep Pladellorens

Proceedings Volume 8413, 84131P (2012) https://doi.org/10.1117/12.978077

KEYWORDS: Speckle pattern, Surface roughness, Speckle, Confocal microscopy, Microscopes, Fourier transforms, Manufacturing, Radium, Scattering, Beam expanders

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SPIE Journal Paper | 1 September 2011 Open Access

Roughness measurement of paper using speckle

Abdiel Pino, Josep Pladellorens Mallofre, Jesús Caum Aregay, Oriol Cusola

OE, Vol. 50, Issue 09, 093605, (September 2011) https://doi.org/10.1117/12.10.1117/1.3625418

KEYWORDS: Speckle, Confocal microscopy, Microscopes, Surface roughness, Speckle pattern, CCD cameras, Scattering, Cameras, Optics manufacturing, Profilometers

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Proceedings Article | 14 September 2010 Paper

Method of measure of roughness of paper based in the analysis of the texture of speckle pattern

A. Pino, J. Pladellorens, J. Colom

Proceedings Volume 7387, 73871W (2010) https://doi.org/10.1117/12.869655

KEYWORDS: Surface roughness, Speckle pattern, Radium, Speckle, Confocal microscopy, Profilometers, Algorithm development, Light scattering, Image analysis, Optics manufacturing

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Proceedings Article | 10 September 2009 Paper

Measure of roughness of paper using speckle

Abdiel Pino, Josep Pladellorens

Proceedings Volume 7432, 74320E (2009) https://doi.org/10.1117/12.825072

KEYWORDS: Surface roughness, Speckle pattern, Speckle, Profilometers, CCD cameras, Printing, Coating, Radium, Statistical analysis, Nickel

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Proceedings Article | 30 May 2003 Paper

System for off-line optical paper inspection and quality control

Hugo Navarrete, Cristina Cadevall, Mouade Bouydain, Joan Anto, Josep Pladellorens, Josep Colom, Agusti Tosas

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500672

KEYWORDS: Image analysis, Statistical analysis, Image processing, Control systems, Inspection, Optical inspection, Confocal microscopy, Microscopes, Detection and tracking algorithms, Scanners

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Proceedings Article | 22 October 2002 Paper

Analysis and characterization of surface defects in ophthalmic lenses

Josep Pladellorens, Jesus Caum, Montserrat Tapias, Cristina Cadevall, Joan Anto, Xavier Fernandez

Proceedings Volume 4780, (2002) https://doi.org/10.1117/12.451806

KEYWORDS: Lenses, Image processing, Diffraction, Sensors, Image analysis, Image segmentation, Defect detection, Binary data, Control systems, Scattering

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Proceedings Article | 13 April 2001 Paper

Surface characterization using confocal microscopy and wavelet transform analysis

Mouade Bouydain, Jose Colom, Joan Anto, Josep Pladellorens

Proceedings Volume 4298, (2001) https://doi.org/10.1117/12.424905

KEYWORDS: Wavelets, Confocal microscopy, Image analysis, 3D image processing, 3D acquisition, Wavelet transforms, Confocal laser scanning microscopy, Microscopes, 3D metrology, Prisms

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Proceedings Article | 19 July 1999 Paper

Paper formation analysis using the power spectrum of light transmission images

Mouade Bouydain, Jose Colom, Rafael Fonolla Navarro, Josep Pladellorens

Proceedings Volume 3749, (1999) https://doi.org/10.1117/12.354962

KEYWORDS: Optical fibers, Image analysis, Fourier transforms, Optical imaging, Manufacturing, Opacity, Radiography, Electron beams, Safety, Mathematics

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SPIE Journal Paper | 1 August 1998

Detection of local defects in textile webs using Gabor filters

Jaume Escofet, Rafael Fonolla Navarro, Maria Millan Garcia-Verela, Josep Pladellorens

OE, Vol. 37, Issue 08, (August 1998) https://doi.org/10.1117/12.10.1117/1.601751

KEYWORDS: Defect detection, Image filtering, Inspection, Image segmentation, Optical engineering, Visualization, Binary data, Prototyping, Image processing, Wavelets

Proceedings Article | 26 August 1996 Paper

Detection of local defects in textile webs using Gabor filters

Jaume Escofet, Rafael Fonolla Navarro, Maria Millan Garcia-Verela, Josep Pladellorens

Proceedings Volume 2785, (1996) https://doi.org/10.1117/12.248537

KEYWORDS: Image filtering, Defect detection, Inspection, Image segmentation, Defect inspection, Visual process modeling, Image analysis, Image processing, Fourier transforms, Convolution

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Proceedings Article | 23 July 1993 Paper

Validation of the morphological method for volume determination in cardiac gammagraphic images

J. Pladellorens

Proceedings Volume 1983, 1983AD (1993) https://doi.org/10.1117/12.2308792

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Showing 5 of 13 publications

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