Mr. Juan Olloniego Profile

Juan Olloniego

at Landing AI

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Publications (1)

Proceedings Article | 27 April 2023 Poster + Paper

Automatic defect classification (ADC) solution using data-centric artificial intelligence (AI) for outgoing quality inspections in the semiconductor industry

Onder Anilturk, Edwin Lumanauw, James Bird, Juan Olloniego, Dillon Laird, Juan Camilo Fernandez, Quinn Killough

Proceedings Volume 12496, 1249635 (2023) https://doi.org/10.1117/12.2658434

KEYWORDS: Performance modeling, Data modeling, Image classification, Defect inspection, Classification systems, Artificial intelligence, Semiconductors, Semiconducting wafers, Machine learning

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