Dr. Junpeng Xue Profile

Dr. Junpeng Xue

at Brookhaven National Lab

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 23 August 2017 Paper

Alignment of KB mirrors with at-wavelength metrology tool simulated using SRW

Mourad Idir, Maksim Rakitin, Bo Gao, Junpeng Xue, Lei Huang, Oleg Chubar

Proceedings Volume 10388, 103880Z (2017) https://doi.org/10.1117/12.2274264

KEYWORDS: Metrology, Mirrors, Optical alignment, Wavefront sensors, Device simulation, Synchrotrons, X-rays, Synchrotron radiation, Wavefront aberrations, In situ metrology

Read Abstract +

Proceedings Article | 13 June 2017 Paper

Three-dimensional shape measurement with modal phase measuring deflectometry

Lei Huang, Junpeng Xue, Bo Gao, Mourad Idir

Proceedings Volume 10449, 1044909 (2017) https://doi.org/10.1117/12.2269017

KEYWORDS: Deflectometry, 3D metrology, Phase measurement, Mathematical modeling, Optical metrology, Ray tracing, 3D modeling, Nonlinear optics, Cameras, 3D acquisition

Read Abstract +

Proceedings Article | 8 September 2016 Presentation + Paper

Control x-ray deformable mirrors with few measurements

Lei Huang, Junpeng Xue, Mourad Idir

Proceedings Volume 9965, 99650H (2016) https://doi.org/10.1117/12.2237808

KEYWORDS: X-rays, Actuators, Deformable mirrors, Metrology, Standards development, Mirrors, Mirrors, Inspection, Time metrology, X-ray optics, Adaptive optics

Read Abstract +

Proceedings Article | 4 March 2015 Paper

High-speed 3D face measurement based on color speckle projection

Junpeng Xue, Xianyu Su, Qican Zhang

Proceedings Volume 9302, 93022Y (2015) https://doi.org/10.1117/12.2076458

KEYWORDS: Speckle, 3D metrology, Cameras, Projection systems, 3D image processing, Modulation, 3D modeling, 3D acquisition, Speckle pattern, Calibration

Read Abstract +

Proceedings Article | 2 June 2014 Paper

Using the auxiliary camera for system calibration of 3D measurement by digital speckle

Junpeng Xue, Xianyu Su, Qican Zhang

Proceedings Volume 9234, 923411 (2014) https://doi.org/10.1117/12.2053228

KEYWORDS: Speckle, Calibration, Cameras, 3D metrology, Imaging systems, Clouds, Digital photography, Projection systems, 3D image processing, Fringe analysis

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years