Dr. Jürgen M. Lobert
Director of AMC Technology at Entegris Inc
SPIE Involvement:
Author
Area of Expertise:
contamination control , AMC filters , analytical instrumentation , atmospheric chemistry , R&D
Websites:
Profile Summary

Jürgen Lobert is the Director of AMC Technology at Entegris, Inc., responsible for two laboratories for world-wide, commercial AMC services and AMC filter research & development. Since joining Entegris’ predecessor Extraction Systems Inc in 2003, Jürgen has been involved in developing analytical methods for detecting airborne molecular contamination (AMC) in lithography cleanroom environments. As a publisher of many peer-reviewed journals and a scientist in the field of atmospheric chemistry as well an active member of SEMI working groups on gases, facilities and liquids and the ITRS Yield Enhancement Group, Jürgen contributes to the understanding of contamination, its reactions and control.
Publications (4)

Proceedings Article | 2 April 2014 Paper
Charles Miller, Emily Zaloga, Jürgen Lobert
Proceedings Volume 9050, 90502D (2014) https://doi.org/10.1117/12.2046199
KEYWORDS: Polymers, Carbon, Statistical analysis, Semiconductors, Extreme ultraviolet, Gases, Deep ultraviolet, Testing and analysis, Humidity, Contamination

Proceedings Article | 2 April 2014 Paper
Tyler Moulton, Emily Zaloga, Katherine Chase, Jürgen Lobert
Proceedings Volume 9050, 90502B (2014) https://doi.org/10.1117/12.2046190
KEYWORDS: Liquids, Humidity, Ions, Solid state electronics, Contamination, Sulfur, Semiconductors, Chemical analysis, Chromatography, Statistical analysis

Proceedings Article | 2 April 2010 Paper
Jürgen Lobert, Philip Cate, David Ruede, Joseph Wildgoose, Charles Miller, John Gaudreau
Proceedings Volume 7638, 763832 (2010) https://doi.org/10.1117/12.848390
KEYWORDS: Silicon, Carbon, Optical filters, Optical lithography, Molecules, Lithography, Contamination, Head-mounted displays, Calibration, Liquids

Proceedings Article | 24 March 2009 Paper
Jürgen Lobert, Charles Miller, Anatoly Grayfer, Anne Tivin
Proceedings Volume 7272, 727222 (2009) https://doi.org/10.1117/12.816277
KEYWORDS: Silicon, Carbon, Calibration, Optical filters, Chemical analysis, Statistical analysis, Contamination, Semiconductors, Head-mounted displays, Ions

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top