Dr. Justin Sigley
Chief Scientist at AmeriCOM
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 June 2018 Presentation + Paper
David Shelton, Justin Sigley, Robert Nicholas, Ron Driggers
Proceedings Volume 10624, 1062411 (2018) https://doi.org/10.1117/12.2295932
KEYWORDS: Sensors, Signal to noise ratio, Staring arrays, Mid-IR, Lead, Crystals, Interference (communication), Electric field sensors, Electronics, Photoresistors

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