In this study, we examined the correlations between the accumulated charge density and triplet-polaron quenching (TPQ) using simultaneous measurement of displacement current and photoluminescence intensity. We applied this technique to metal-insulator-semiconductor devices where a model structure of an Ir(ppy)3-based OLED was involved, in order to investigate the contribution of unipolar charge accumulation. This technique allows us to investigate not only the TPQ rate constant but also the detailed charge distribution around the EML that is influenced by SOP. The results suggest that the SOP management is an important issue to optimize the device performance of OLEDs.
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