Dr. Kazuya Goto
at JEOL Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 26 May 2010 Paper
Tadashi Komagata, Takahisa Hasegawa, Kazuya Goto, Kenji Kono, Ryuuji Yamamoto, Naoki Nishida, Yasutoshi Nakagawa
Proceedings Volume 7748, 77480I (2010) https://doi.org/10.1117/12.866750
KEYWORDS: Photomasks, Lithography, Extreme ultraviolet lithography, Electron beams, Beam shaping, Semiconductors, Measurement devices, Double patterning technology, Critical dimension metrology, Interferometers

Proceedings Article | 19 May 2008 Paper
Noriyuki Kobayashi, Kazuya Goto, Tetsuro Wakatsuki, Tadashi Komagata, Yasutoshi Nakagawa
Proceedings Volume 7028, 70281Y (2008) https://doi.org/10.1117/12.793076
KEYWORDS: Photomasks, Electron beams, Electron beam lithography, Raster graphics, Mask making, Chemically amplified resists, Semiconductors, Roads, Double patterning technology, Lithography

Proceedings Article | 14 May 2007 Paper
Proceedings Volume 6607, 660721 (2007) https://doi.org/10.1117/12.728984
KEYWORDS: Critical dimension metrology, Photomasks, Mask making, Electron beams, Chemically amplified resists, Electron beam lithography, Resolution enhancement technologies, Temperature metrology, Semiconductors, Roads

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