Fringe pattern profilometry (FPP) is one of the most promising 3D profile measurement techniques, which has been
widely applied in many areas. A challenge problem associated with FPP is the unwrapping of wrapped phase maps
resulted from complex object surface shapes. Although existing quality-guided phase unwrapping algorithms are able to
solve such a problem, they are usually extensively computational expensive and not able to be applied to fast 3D
measurement scenarios. This paper proposes a new quality-guided phase unwrapping algorithm with higher
computational efficiency than the conventional ones. In the proposed method, a threshold of quality value is used to
classify pixels on the phase maps into two types: high quality (HQ) pixels corresponding to smooth phase changes and
low quality (LQ) ones to rough phase variance. In order to improve the computational efficiency, the HQ pixels are
unwrapped by a computationally efficient fast phase unwrapping algorithm, and the LQ pixels are unwrapped by
computational expensive flood-fill algorithm. Experiments show that the proposed approach is able to recover complex
phase maps with the similar accuracy performance as the conventional quality-guided phase unwrapping algorithm but is
much faster than the later.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.