Transform methods have played an important role in signal and image processing applications. Recently, Selesnick has
constructed the new orthogonal discrete wavelet transform, called the slantlet wavelet, with two zero moments and with
improved time localization. The discrete slantlet wavelet transform is carried out by an existing filterbank which lacks a
tree structure and has a complexity problem. The slantlet wavelet has been successfully applied in compression and
denoising. In this paper, we present a new class of orthogonal parametric fast Haar slantlet transform system where the
slantlet wavelet and Haar transforms are special cases of it. We propose designing the slantlet wavelet transform using
Haar slantlet transform matrix. A new class of parametric filterbanks is developed. The behavior of the parametric Haar
slantlet transforms in signal and image denoising is presented. We show that the new technique performs better than the
slantlet wavelet transform in denoising for piecewise constant signals. We also show that the parametric Haar slantlet
transform performs better than the cosine and Fourier transforms for grey level images.
The purpose of this paper is to develop a class of generalized parametric Slant-Hadamard transform of order (formula available in paper)where k is an arbitrary integer and to present its fast algorithm. As special cases of this class are the classical Slant-Hadamard (k=2 and βN=1), the generalized Slant-Hadamard (βN=1), and the parametric Slant-Hadamard (k=2) transforms. We will show that the parametric Slant-Hadamard transform is slightly superior to the DCT for compression of the geometric test images at a particular quantization matrix scaling factors.
A new 60 GHz open resonator system has been developed to measure the permittivity and loss tangent of low-loss microwave and millimeter wave hard substrate materials. The system uses a new measurement method namely the cavity-length variation technique to determine the position difference and the profile of the resonance peak with and without the specimen for the calculation of the permittivity and loss tangent. A 20-nanometer length resolution is reached for the variation of the cavity length. This new technique provides an interferogram containing a number of resonance peaks with and without the specimen each having a complete Gaussian or Lorentzian profile. The real part of the dielectric permittivity and loss tangent can now be determined accurately. It is no longer necessary to use a stable, wide- band and tunable frequency source. The accurate data for some hard substrate materials is obtained, excellent agreement is obtained between the new data and the data extrapolated from the Fourier Transform Spectroscopy technique measurements.
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