Dr. Lailin Ji
Researcher at Shanghai Institute of Optics and Fine Mechanics
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | 27 March 2020
Yuanjun Wu, Yanqi Gao, Quan Zheng, Lailin Ji, Yong Cui, Fujian Li, Yilin Hua, Weixin Ma, Zhan Sui
OE, Vol. 59, Issue 03, 036111, (March 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.3.036111
KEYWORDS: Lasers, Monochromatic aberrations, Mirrors, Thermal effects, Optical amplifiers, Optical engineering, Heatsinks, Spherical lenses, Thermal optics, Diamond

Proceedings Article | 8 July 2019 Paper
Xiuqing Jiang, Lailin Ji, Mingying Sun, Chong Liu, Yajing Guo, Shunxing Tang, Dong Liu, Boaqing Zhu, Jianqiang Zhu
Proceedings Volume 11063, 110630Q (2019) https://doi.org/10.1117/12.2540116
KEYWORDS: Crystals, Laser crystals, High power lasers, Pulsed laser operation, Laser systems engineering, Laser energy, Laser induced damage, Frequency conversion, Crystal optics, Fusion energy

SPIE Journal Paper | 29 June 2018
Fujian Li, Yanqi Gao, Xiaohui Zhao, Lailin Ji, Wei Wang, Xiuguang Huang, Weixin Ma, Zhan Sui, Wenbing Pei
OE, Vol. 57, Issue 06, 066117, (June 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.6.066117
KEYWORDS: Near field, Picosecond phenomena, Spatial frequencies, Optical engineering, Computer simulations, Lithium, Plasma, Near field optics, National Ignition Facility, Speckle pattern

Proceedings Article | 14 July 2015 Paper
Xiuqing Jiang, Dong Liu, Lailin Ji, Shunxing Tang, Yajing Guo, Baoqiang Zhu, Yanqi Gao, Zunqi Lin
Proceedings Volume 9532, 95320C (2015) https://doi.org/10.1117/12.2186012
KEYWORDS: Silica, Laser damage threshold, Laser induced damage, Plasma, Optical components, Ultraviolet radiation, Absorption, Laser energy, Neodymium glass lasers, Photons

Proceedings Article | 12 January 2012 Paper
Baoan Liu, Lailin Ji, Guohang Hu, Yuanan Zhao, Mingxia Xu, Shaohua Ji, Lili Zhu, Lisong Zhang, Zhengping Wang, Xun Sun, Xinguang Xu
Proceedings Volume 8206, 82062H (2012) https://doi.org/10.1117/12.910489
KEYWORDS: Crystals, Laser crystals, Laser induced damage, Laser damage threshold, Annealing, Crystallography, Charge-coupled devices, Harmonic generation, Resistance, Plasmas

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