Dr. Laurent Vonna
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 March 2020 Presentation + Paper
Nicolas Verrier, Ludovic Foucault, Matthieu Debailleul, Jean-Baptiste Courbot, Bruno Colicchio, Bertrand Simon, Laurent Vonna, Olivier Haeberlé
Proceedings Volume 11351, 1135106 (2020) https://doi.org/10.1117/12.2559200
KEYWORDS: Microscopy, Tomography, Diffraction

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