This paper aims at reducing the bias distortion in familiar sub-pixel analysis algorithm in miniature spectrometer. The process of sub-pixel analysis is modeled and the fallibility in reported sub-pixel analysis algorithm is discussed. The discussion suggests that an important inducement for distortion is cumulated errors. Hence, an averaged sup-pixel analysis algorithm is put forward. According to the new algorithm, the same iteration is executed twice but in opposite directions and results of the same sub-pixels are averaged. Relative simulation indicates that compare with old ones the new algorithm reduces bias distortion by several times and contributes to an enhanced resolution and wavelength accuracy.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.