Prof. Liam Blunt Profile

Prof. Liam Blunt

at Univ. of Huddersfield

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Author

Publications (5)

Proceedings Article | 25 April 2023 Presentation + Paper

In-process surface metrology for thin film flexible electronic devices

Liam Blunt, Hussam Muhamedsalih, Mothana Hassan, David Bird, Dan Kolb, Prashant Kumar, Dawei Tang, James Williamson

Proceedings Volume 12490, 1249007 (2023) https://doi.org/10.1117/12.2657501

KEYWORDS: Printing, Metrology, Manufacturing, Phase shifts, Optical surfaces, Interferometers, Interferograms, Flexible circuits, Thin films, Interferometry

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Proceedings Article | 5 August 2015 Paper

In-situ defect detection systems for R2R flexible PV barrier films

F. Gao, H. Muhamedsalih, D. Tang, M. Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis

Proceedings Volume 9622, 96220E (2015) https://doi.org/10.1117/12.2193140

KEYWORDS: Inspection, Photovoltaics, Defect detection, Environmental sensing, Interferometry, Interferometers, Objectives, Manufacturing, Metrology, CCD cameras

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Proceedings Article | 31 January 2013 Paper

Three-dimensional measurement and characterization of grinding tool topography

Changcai Cui, Liam Blunt, Xiangqian Jiang, Xipeng Xu, Hui Huang, Ruifang Ye

Proceedings Volume 8759, 87590Q (2013) https://doi.org/10.1117/12.2015004

KEYWORDS: Surface finishing, Diamond, Abrasives, Photomicroscopy, Software development, Precision measurement, Microscopes, Manufacturing, Optical microscopes, Optical microscopy

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Proceedings Article | 31 December 2008 Paper

Determining sample size in binary measurement system

Yan Zhao, Zhen He, Liam Blunt, Xiangqian Jiang, Yanlong Cao, Hongyu Zhang

Proceedings Volume 7130, 71305X (2008) https://doi.org/10.1117/12.819773

KEYWORDS: Binary data, Analytical research, Manufacturing, Mechanical engineering, Reliability, Data acquisition, Environmental sensing, Computing systems, Optical inspection, Statistical modeling

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Proceedings Article | 16 September 2002 Paper

Pattern recognition for optical PSI images of surface topography using wavelets

Xiangqian Jiang, Shaojun Xiao, Liam Blunt

Proceedings Volume 4929, (2002) https://doi.org/10.1117/12.483206

KEYWORDS: Wavelets, Radon transform, Feature extraction, Wavelet transforms, Head, Continuous wavelet transforms, Discrete wavelet transforms, Radon, Optical pattern recognition, Image processing

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