Ms. Ling Xie Profile

Ling Xie

at Institute of Microelectronics of the CAS

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Publications (1)

Proceedings Article | 10 October 2020 Poster + Paper

Test system for wafer-level silicon-photonics testing

Peng Zhang, Bo Tang, Yan Yang, Bin Li, Ruonan Liu, Ling Xie, Zhihua Li, Fujiang Lin

Proceedings Volume 11548, 115481B (2020) https://doi.org/10.1117/12.2573456

KEYWORDS: Wafer testing, Silicon photonics, Optical communications, Optical interconnects, Active optics, Wafer-level optics, Electro-optic testing, Electro optics, Optical testing

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