The wave plate is an indispensable optical element for transforming polarization state in various optical fields. In the retarder’s applications, precise measurement of the retardance is necessary. However, there is no common and effective way to analyze resolution of the retardance measuring instrument. For ensuring the retardance measurement accuracy, an analysis method involving a wedge wave plate with a tiny angle between two planes is proposed to characterize the resolution. The retardance of the wedge wave plate varies linearly and slightly due to its linear and diminutive variation of thickness. The diminutive variation of retardance versus displacement can be measured when the instrument has enough resolution. And the instrument demonstrates higher resolution when it can measure smaller retardance variation. In the experiment, a wedge wave plate is mounted on a two dimensions stage and its one surface is normal to the detecting light of the instrument. And then the retardance is measured along one certain direction and the results are fitted linearly. The method can be used to evaluate the resolution differences of retardance measurement instruments. The gained resolution of both two instruments is superior to 0.1nm. Through several experiments, it can be demonstrated that the proposed analysis method has the advantages of easy operation, high efficiency and simple configuration.
Iris recognition technology has advantages of high security and high stability and can realize non-contact and living recognition. For iris recognition, iris localization is the first step. The localization precision is assurance of high recognition rate. The existing iris localization method has shortage of slow speed. In this paper, an improved iris region localization method is proposed. Firstly, the images are preprocessed with Gaussian blur algorithm. Then the center of the pupil is coarsely located by Gaussian template convolution operation. Finally, the center and the outer edge of the iris are precisely located based on the Integral-differential operation. In experiments, CASIA iris database is used to test the improved iris region localization method. The results show that the location time can be less than 200 ms and the location precision can reach 98. 82%. This method’s usefulness is verified and can promote the application of the iris recognition
A polarizer-compensator-sample-analyzer (PCSA) imaging ellipsometer with large field of view is presented. The sample is imaged on a CCD sensor by a telecentric imaging system and its tilt is monitored by an optical autocollimator. The sample, the telecentric imaging system and the CCD sensor satisfy the Scheimpflug condition. In measurement, the light extinction measurement method and the four quadrants average method are used to improve the accuracy. In experiments, a chromium thin film sample is measured by the imaging ellipsometer and a spectroscopic ellipsometer. The measurement results by two ellipsometers are consistent. The usefulness of the imaging ellipsometer is verified.
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