This paper investigates correlation between extended source fraction of encircled energy (FEE) and modulation transfer function (MTF) of an optical system from a metrology point of view. Statistics of FEE for a population of lenses was calculated by using a Monte Carlo simulation incorporating manufacturing tolerances. MTF and extended FEE of a group of lenses were measured. The simulation and measured data demonstrates no correlation between extended FEE and MTF signifying the necessity of separate FEE measurement if essential.
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