Dr. Marc M. Ellenrieder Profile

Dr. Marc M. Ellenrieder

at Airbus Defence and Space

SPIE Involvement:

Author

Proceedings Article | 23 July 2008 Paper

The optical components of the NIRSpec wheel mechanisms

Marc Ellenrieder, K. Weidlich, B. Nelles, B. Ploss, S. Bruynooghe, J. Köhler, M. Te Plate

Proceedings Volume 7018, 701822 (2008) https://doi.org/10.1117/12.789727

KEYWORDS: Optical filters, Prisms, Optical components, Mirrors, Coating, Manufacturing, Cryogenics, Optoelectronics, Optics manufacturing, Optical design

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Proceedings Article | 23 July 2008 Paper

High-precision cryogenic wheel mechanisms for the JWST NIRSpec instrument

Kai Weidlich, Manfred Fischer, Marc Ellenrieder, Torsten Gross, Jean-Christophe Salvignol, Reiner Barho, Christian Neugebauer, Günter Königsreiter, Michael Trunz, Friedrich Müller, Oliver Krause

Proceedings Volume 7018, 701821 (2008) https://doi.org/10.1117/12.789663

KEYWORDS: Optical components, Optical alignment, Cryogenics, Prisms, Optical filters, Position sensors, Sensors, Aerospace engineering, Magnetism, James Webb Space Telescope

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Proceedings Article | 6 July 2006 Paper

The grating and filter wheels for the JWST NIRSpec instrument

K. Weidlich, M. Sedlacek, M. Fischer, M. Trunz, M. Ellenrieder, D. Lemke, O. Krause, R. Hofferbert, U. Grözinger, G. Königsreiter, C. Neugebauer

Proceedings Volume 6273, 627323 (2006) https://doi.org/10.1117/12.670692

KEYWORDS: Optical filters, Optical components, Prisms, Diffraction gratings, Cryogenics, Position sensors, Optical design, James Webb Space Telescope, Mirrors, Structural design

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Proceedings Article | 13 June 2005 Paper

Reflectivity function based illumination and sensor planning for industrial inspection

Marc Ellenrieder, Christian Wohler, Pablo d'Angelo

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612547

KEYWORDS: Inspection, Sensors, Reflectivity, Bidirectional reflectance transmission function, Cameras, Visibility, Camera shutters, Lamps, Aluminum, Image segmentation

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Proceedings Article | 11 March 2005 Paper

Model-based automatic calculation and evaluation of camera positions for industrial machine vision

Marc Ellenrieder, Hitoshi Komoto

Proceedings Volume 5674, (2005) https://doi.org/10.1117/12.585427

KEYWORDS: Cameras, Inspection, Visibility, Sensors, Model-based design, Computer aided design, Optical spheres, Machine vision, Content addressable memory, Visual process modeling

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Proceedings Article | 17 January 2005 Paper

Pose estimation of tube-shaped flexible objects from geometrically rectified shadow images

Marc Ellenrieder

Proceedings Volume 5675, (2005) https://doi.org/10.1117/12.585044

KEYWORDS: Cameras, Lamps, Image processing, Light sources, Distortion, Calibration, Machine vision, Inspection, Model-based design, 3D image processing

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Proceedings Article | 21 May 2004 Paper

Shape reconstruction of flexible objects from monocular images for industrial applications

Marc Ellenrieder

Proceedings Volume 5299, (2004) https://doi.org/10.1117/12.525080

KEYWORDS: 3D modeling, 3D image processing, Distortion, Cameras, Reconstruction algorithms, Data modeling, Inspection, Optical inspection, Stereoscopic cameras, Optimization (mathematics)

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Proceedings Article | 28 May 2003 Paper

A general approach for multifeature multisensor classification and localization of 3D objects in 2D image sequences

Thorsten Koelzow, Marc Ellenrieder

Proceedings Volume 5014, (2003) https://doi.org/10.1117/12.477727

KEYWORDS: 3D modeling, 3D image processing, Data modeling, Image processing, Receptors, Solid modeling, Image classification, Optical inspection, Process modeling, Model-based design

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Showing 5 of 8 publications

Conference Committee Involvement (5)

Image Processing: Machine Vision Applications III

20 January 2010 | San Jose, California, United States

Image Processing: Machine Vision Applications II

22 January 2009 | San Jose, California, United States

Image Processing: Machine Vision Applications

29 January 2008 | San Jose, California, United States

Machine Vision Applications in Industrial Inspection XV

29 January 2007 | San Jose, CA, United States

Machine Vision Applications in Industrial Inspection XIV

16 January 2006 | San Jose, California, United States

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