Dr. Masaki Yoshioka
at Ushio Opto Semiconductors Inc
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 17 April 2014 Paper
Yusuke Teramoto, Bárbara Santos, Guido Mertens, Ralf Kops, Margarete Kops, Felix Küpper, Gota Niimi, Hironobu Yabuta, Akihisa Nagano, Takuma Yokoyama, Masaki Yoshioka, Takahiro Shirai, Noritaka Ashizawa, Hiroto Sato, Kiyotada Nakamura, Kunihiko Kasama
Proceedings Volume 9048, 904813 (2014) https://doi.org/10.1117/12.2046423
KEYWORDS: Extreme ultraviolet, Inspection, Photomasks, Plasma, Tin, Laser stabilization, Reliability, Extreme ultraviolet lithography, Electrodes, Lithography

SPIE Journal Paper | 29 May 2012
Guido Schriever, Olivier Semprez, Jeroen Jonkers, Masaki Yoshioka, Rolf Apetz
JM3, Vol. 11, Issue 02, 021104, (May 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.2.021104
KEYWORDS: Tin, Plasma, Extreme ultraviolet, Gas lasers, Extreme ultraviolet lithography, Photons, Mirrors, Light sources, Pulsed laser operation, Carbon monoxide

Proceedings Article | 7 April 2011 Paper
Masaki Yoshioka, Yusuke Teramoto, Jeroen Jonkers, Max Schürmann, Rolf Apetz, Volker Kilian, Marc Corthout
Proceedings Volume 7969, 79691G (2011) https://doi.org/10.1117/12.879386
KEYWORDS: Tin, Scanners, Plasma, Extreme ultraviolet lithography, Extreme ultraviolet, Semiconducting wafers, Light sources, High volume manufacturing, Laser applications, Semiconductors

Proceedings Article | 20 March 2010 Paper
Proceedings Volume 7636, 763610 (2010) https://doi.org/10.1117/12.846545
KEYWORDS: Extreme ultraviolet, Tin, Scanners, Extreme ultraviolet lithography, Plasma, Ultraviolet radiation, Reliability, Semiconducting wafers, Lithography, Electrodes

Proceedings Article | 18 March 2009 Paper
Masaki Yoshioka, Denis Bolshukhin, Marc Corthout, Günther Derra, Sven Götze, Jeroen Jonkers, Jürgen Kleinschmidt, Rainer Müller, Max Schürmann, Guido Schriever, Rob Snijkers, Peter Zink
Proceedings Volume 7271, 727109 (2009) https://doi.org/10.1117/12.814100
KEYWORDS: Extreme ultraviolet lithography, Extreme ultraviolet, Xenon, Plasma, Tin, Integrated optics, Scanners, Curtains, Electrodes, Reliability

Showing 5 of 15 publications
Conference Committee Involvement (4)
Extreme Ultraviolet (EUV) Lithography VI
23 February 2015 | San Jose, California, United States
Extreme Ultraviolet (EUV) Lithography V
24 February 2014 | San Jose, California, United States
Extreme Ultraviolet (EUV) Lithography IV
25 February 2013 | San Jose, California, United States
Extreme Ultraviolet (EUV) Lithography III
13 February 2012 | San Jose, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top