Dr. Massimo D'agostino
at University of Naples Federico II
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 June 2024 Presentation + Paper
Proceedings Volume 12997, 1299705 (2024) https://doi.org/10.1117/12.3022945
KEYWORDS: Tomography, Virtual reality, Refractive index, Yeast, Microscopy, Inspection, Phase contrast, Image segmentation, Fluorescence, 3D metrology

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