While there are many variations of an Inelastic X-ray Scattering (IXS) spectrometer, the figure of merit is often the energy resolution and the throughput. As part of the LCLS-II-HE project, the DXS team is developing a hard X-ray IXS spectrometer with a resolution of 5 meV at 11.215 keV. The spectrometer relies on a so-called post-sample-collimation scheme, and this high degree of resolution comes with stringent precision and stability requirements. SHADOWOui is used to simulate the setup and analyze the tolerance of 4 optics’ axis (translation, pitch, yaw, roll) and the miscut angle of the channel-cut crystal of the design. The simulation indicates that a 5 meV resolution is achievable by ensuring stringent pitch and vertical translation tolerances. Furthermore, the simulation suggests that a miscut angle of 77 degrees, which necessitates high-quality crystal manufacturing, is optimal.
The hard x-ray instruments at the Linac Coherent Light Source are in the design phase for upgrades that will take full advantage of the high repetition rates that will become available with LCLS-II-HE. The current x-ray correlation spectroscopy instrument will be converted to the dynamic x-ray scattering instrument and will feature a meV-scale high-resolution monochromator at its front end with unprecedented coherent flux. With the new capability come many engineering and design challenges, not least of which is the sensitivity to long-term drift of the optics. With this in mind, we have estimated the system tolerance to angular drift and vibration for all the relevant optics (approximately ten components) in terms of how the central energy out of the monochromator will be affected to inform the mechanical design. Additionally, we have started planning for methods to correct for such drifts using available (both invasive and non-invasive) x-ray beam diagnostics. In simulations, we have demonstrated the ability of trained Machine Learning models to correct misalignments to maintain the desired central energy and optical axis within the necessary tolerances. Additionally, we exhibit the use of Bayesian Optimization to minimize the impact of thermal deformations of crystals as well as beam alignment from scratch. The initial results are very promising and efforts to further extend this work are ongoing.
The goal of the dual KB mirror system for the CXI beamline of the LCLS-HE upgrade is to realize both micro-focusing and nano-focusing functions over a photon energy range of 7-21 keV. This system consists of two pairs of bendable mirrors with the length of 1 m. The dynamical range of the mirror bending is up to 104 due to the fine adjustment of the focusing length to 1 mm over a 10 m range. The prefigured shape and the width profile of each mirror are optimized to have good performance for both functions.
With the nearly full spatial coherence of X-ray free electron lasers comes unprecedented requirements on the precise figure of X-ray mirrors. For example, the Time-resolved AMO Instrument (TMO) requires a bendable Kirkpatrick-Baez (KB) mirror system in order to produce a range of focus spot sizes, while maintaining nm-level figure error across the corresponding range of elliptical shapes. Here we describe the process of TMO KB mirror characterization using optical metrology, the detailed comparison with at-wavelength wavefront sensors during instrument commissioning, and the implementation of an automatic focusing system that ties together the wavefront sensor output with the mirror bender controls.
The thermal deformation requirement for wavefront preservation through an X-ray crystal monochromator is found to restrict the standard deviation of the height error to less than 25 pm under certain conditions. By optimizing effective cooling temperature of liquid nitrogen cooled crystals, combined with the compensation of second order component in thermal deformation, we have an approach to reach this unprecedented requirement. As an example, the criteria on thermal deformation of a high heat-load monochromator crystal for a LCLS-II-HE beamline can be achieved for 100 W FEL beam. Wavefront propagation simulations confirm that the reflected beam intensity profile is satisfactory.
Many questions regarding dynamic materials could be answered by using time-resolved ultra-fast imaging techniques to characterize the physical and chemical behavior of materials in extreme conditions and their evolution on the nanosecond scale. In this work, we perform multi-frame phase-contrast imaging (PCI) of micro-voids in low density polymers under laser-driven shock compression. At the Matter in Extreme Conditions (MEC) Instrument at the Linac Coherent Light Source (LCLS), we used a train of four x-ray free electron laser (XFEL) pulses to probe the evolution of the samples. To visualize the void and shock wave interaction, we deployed the Icarus V2 detector to record up to four XFEL pulses, separated by 1-3 nanoseconds. In this work, we image elastic waves interacting with the micro-voids at a pressure of several GPa. Monitoring how the material’s heterogeneities, like micro-voids, dictate its response to a compressive wave is important for benchmarking the performances of inertial confinement fusion energy materials. For the first time in a single sample, we have combined an ultrafast x-ray framing camera and four XFEL pulse train to create an ultrafast movie of micro-void evolution under laser-driven shock compression. Eventually, we hope this technique will resolve the material density as it evolves dynamically under laser shock compression.
For LCLS-II, we have developed fluorescence intensity monitors and power meters as intensity monitors. The Fluorescence Intensity Monitor (FIM) provides the non-invasive, pulse-by-pulse normalization of experiments. For the LCLS-II instruments, the diagnostic was constructed with an array of four microchannel plate assemblies and four avalanche photodiodes. The diagnostics are being installed in each Kirkpatrick Baez mirror chamber. The noise of the diagnostic will be evaluated against a goal of 1 %.
The X-ray power meter delivers average power values. For the LCLS-II instruments, a power meter was selected compatible with high average power. In the LCLS-II instruments, power meters are being installed with each profile monitor in order to evaluate the transmission along the X-ray transport. A calibration of a set of power meters was carried out against a gas monitor detector at FLASH. In addition for all the power meters, a relative calibration was performed with a visible light source. At the endstations, a power meter will determined the pulse energy at the sample.
The focusing mirrors for the new LCLS soft x-ray (SXR) experimental hutches are tangential pre-shaped mirrors mounted in a Kirkpatrick Baez configuration. The mirrors are prefigured with an elliptical profile, coinciding with the longest working focal distance. The mirrors are equipped with benders to enable focusing of the beam at different experimental stations and to work out of focus with an uniform beam. To add complexity to the system, the mirrors are also water-cooled and need to fit in a very tight space, due to real estate limitation.
For ensuring that the mirror profile is maintained at its sub-nm quality after the assembly of the mirror into its cooling and mechanical system, these mirrors need to undergo an extensive optics metrology study. The vertical and horizontal KB mirrors are first checked for twist error due to the mounting of the mirror substrate to its mechanics. This is measured with grazing incidence Fizeau interferometry. Then the mounted mirror needs to be shimmed to correct for any errors that may be caused by gluing of the mirror. This step requires a sequence of shimming and metrology measurement and must be repeated until the mirror shape is satisfactory.
In addition, the mirror bender response function must be well-characterized and documented for the commissioning as well as operation of these mirrors in the experimental hutches. The response function can be attained by measuring the mirror profile using the instruments available in the LCLS Optics Metrology Laboratory and the stitching techniques developed at LCLS. The mirrors are scheduled to be installed in the new SXR beamline in spring 2020. Metrology data and initial commissioning results proving the performance of these wavefront preserving optics will be presented in this report.
In this work we present the application of a 2D single grating wavefront sensor to align and characterize the 100 nm focus at the Coherent X-ray Imaging (CXI) endstation at the Linac Coherent Light Source (LCLS). The results agree well with a model of the system, indicating that the mirrors perform as designed when alignment is optimized. In addition, a comparison with the imprint technique confirms the validity of the results, which showed that wavefront-based alignment resulted in negligible astigmatism. Analysis of the retrieved focus profile indicates that intensities <1021 W=cm2 are achievable with currently available LCLS beam parameters and optimal mirror alignment.
In X-ray Free-Electron Lasers (FELs), intense and coherent pulses are generated via amplification of the undulator radiation from micro-bunched electron pulses. The initial radiation is spontaneous and intrinsically stochastic, thus causing shot-to-shot fluctuations in the intensity, pointing, and spatiotemporal profile of the X-ray beam. In this work, we use deep neural networks to investigate the fluctuations in X-ray beam profiles, thereby obtaining statistical information on the lasing process. A supervised model was built to classify X-ray images, and an unsupervised one to study the distribution of beam profiles. We have found that round-shaped profiles appear more often with increasing monochromator bandwidth, suggesting that some round-shaped images can be superpositions of higher-order modes. Our results also suggest that the X-ray beam continues to evolve past the FEL saturation length towards a round-shaped beam profile.
Preserving the coherence and wavefront of a diffraction limited x-ray beam from the source to the experiment poses stringent quality requirements on the production processes for X-ray optics. In the near future this will require on-line and in-situ at-wavelength metrology for both, free electron lasers and diffraction limited storage rings. A compact and easy to move X-ray grating interferometry (XGI) setup has been implemented by the Beamline Optics Group at PSI in order to characterize x-ray optical components by determining the aberrations from reconstructing the x-ray wavefront. The XGI setup was configured for measurements in the moire mode and tested with focusing optic at Swiss Light Source, Diamond Light Source and LCLS. In this paper measurements on a bendable toroidal mirror, a zone plate, a single and a stack of beryllium compound refractive lenses (CRL) are presented. From these measurements the focal position and quality of the beam spot in terms of wavefront distortions are determined by analysing the phase-signal obtained from the XGI measurement. In addition, using a bendable toroidal mirror, we directly compare radius of curvature measurements obtained from XGI data with data from a long-trace profilometer, and compare the CRL wavefront distortions with data obtained by ptychography.
We demonstrate hyperspectral coherent imaging in the EUV spectral region for the first time, without the need for hardware-based wavelength separation. This new scheme of spectromicroscopy is the most efficient use of EUV photons for imaging because there is no energy loss from mirrors or monochromatizing optics. An EUV spectral comb from a tabletop high-harmonic source, centered at a wavelength of 30nm, illuminates the sample and the scattered light is collected on a pixel-array detector. Using a lensless imaging technique known as ptychographical information multiplexing, we simultaneously retrieve images of the spectral response of the sample at each individual harmonic. We show that the retrieved spectral amplitude and phase agrees with theoretical predictions. This work demonstrates the power of coherent EUV beams for rapid material identification with nanometer-scale resolution.
Coherent diffraction imaging (CDI) has matured into a versatile phase-contrast microscopy technique capable of producing diffraction limited images without the need for high precision focusing elements. CDI has been most appropriately applied in the EUV/X-ray region of the spectrum where imaging optics are both difficult to produce and inefficient. By satisfying basic geometric constraints (such as Nyquist sampling of scattered intensities) diffraction imaging techniques essentially replace any imaging elements with sophisticated computer algorithms. We demonstrate the utility of our CDI-based, phase-contrast EUV microscope by quantitatively imaging objects in both transmission and reflection. Patterned feature depth is obtained in transmission using keyhole coherent diffraction imaging (KCDI) and feature height is quantitatively extracted in the first general, table-top reflection mode CDI microscope.
Recent breakthroughs in high harmonic generation have extended the reach of bright tabletop coherent light sources
from a previous limit of ≈100 eV in the extreme ultraviolet (EUV) all the way beyond 1 keV in the soft X-ray region.
Due to its intrinsically short pulse duration and spatial coherence, this light source can be used to probe the fastest
physical processes at the femtosecond timescale, with nanometer-scale spatial resolution using a technique called
coherent diffractive imaging (CDI). CDI is an aberration-free technique that replaces image-forming optics with a
computer phase retrieval algorithm, which recovers the phase of a measured diffraction amplitude. This technique
typically requires the sample of interest to be isolated; however, it is possible to loosen this constraint by imposing
isolation on the illumination. Here we extend previous tabletop results, in which we demonstrated the ability to image a
test object with 22 nm resolution using 13 nm light [3], to imaging of more complex samples using the keyhole CDI
technique adapted to our source. We have recently demonstrated the ability to image extended objects in a transmission
geometry with ≈100 nm resolution. Finally, we have taken preliminary CDI measurements of extended nanosystems in
reflection geometry. We expect that this capability will soon allow us to image dynamic processes in nanosystems at the
femtosecond and nanometer scale.
Coherent diffractive imaging (CDI) using EUV/X-rays has proven to be a powerful microscopy method for imaging nanoscale objects. In traditional CDI, the oversampling condition limits its applicability to small, isolated objects. A new technique called keyhole CDI was demonstrated on a synchrotron X-ray source to circumvent this limitation. Here we demonstrate the first keyhole CDI result with a tabletop extreme ultraviolet (EUV) source. The EUV source is based on high harmonic generation (HHG), and our modified form of keyhole CDI uses a highly reflective curved EUV mirror instead of a lossy Fresnel zone plate, offering a ~10x increase in photon throughput of the imaging system, and a more uniform illumination on the sample. In addition, we have demonstrated a record 22 nm resolution using our tabletop CDI setup, and also the successful extension to reflection mode for a periodic sample. Combining these results with keyhole CDI will open the path to the realization of a compact EUV microscope for imaging general non-isolated and non-periodic samples, in both transmission and reflection mode.
We implement coherent diffractive imaging (CDI) using a phase-matched high-harmonic generation (HHG) source
at 13 nm, demonstrating reconstructed images with a record 22 nm resolution for any tabletop, light-based
microscope. We also demonstrate the first reflection-mode CDI using a compact extreme ultraviolet (EUV)
source, achieving ≈100 nm resolution. A clear path towards even higher spatial resolution reflection-mode
tabletop imaging using apertured-illumination schemes will be discussed.
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