For fabrication of high-performance mirror devices, technical aluminum alloys Al6061 or Al905 are widely used. The surface error topography after manufacturing by single-point diamond turning is applicable in the infrared spectral range. For increasing demands on the optical surface quality in the shortwave visible and ultraviolet spectral range, further improvement of the surface roughness is required. Hence, a promising alternative process to attain the required surface quality is evaluated. Within the ion beam planarization technique, a photoresist layer is deposited by conventional spin coating or spray coating technologies exhibiting an ultrasmooth surface. When removing the resist by reactive ion beam etch (RIBE) processing using nitrogen process gas, the ultrasmooth surface topography of the resist is transferred into the substrate. We optimized the photoresist thermal pretreatment to realize roughness preservation and a steady-state material removal rate during RIBE machining. The optimum preparation steps are explored based on roughness evaluation, chemical modification, and etch resistance of the negative photoresist. Reactive ion beam etching-based planarization is conducted on single-point diamond turned RSA Al905 and RSA Al6061 samples made of rapidly solidified aluminum (RSA) in a two-step process. The optimum process and the roughness evaluation are explored by topographic analysis applying a combination of white light interferometry and atomic force microscopy measurements.