Mr. Michael Farrier Profile

Michael Farrier

Sr. Engineer at Teledyne Rad-icon Imaging Corp

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Author

Publications (8)

Proceedings Article | 19 March 2014 Paper

Amorphous selenium direct detection CMOS digital x-ray imager with 25 micron pixel pitch

Christopher Scott, Shiva Abbaszadeh, Sina Ghanbarzadeh, Gary Allan, Michael Farrier, Ian Cunningham, Karim Karim

Proceedings Volume 9033, 90331G (2014) https://doi.org/10.1117/12.2043770

KEYWORDS: Modulation transfer functions, X-rays, X-ray imaging, CMOS sensors, Imaging systems, Sensors, Spatial resolution, Selenium, X-ray detectors, Gold

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Proceedings Article | 15 May 2000 Paper

Ultrahigh-definition experimental camera system with an 8M-pixel CCD

Kohji Mitani, Masayuki Sugawara, Hiroshi Shimamoto, Charles Smith, Michael Farrier, Queintin Tang, Fumio Okano

Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385437

KEYWORDS: Cameras, Imaging systems, Charge-coupled devices, Video, Digital signal processing, Signal processing, CCD cameras, Image resolution, Analog electronics, Image quality

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Proceedings Article | 5 November 1998 Paper

50-megapixel CCD image sensor with motion compensation

William Pfister, James Steele, Michael Farrier, Charles Smith

Proceedings Volume 3431, (1998) https://doi.org/10.1117/12.330197

KEYWORDS: Charge-coupled devices, Staring arrays, Cameras, CCD image sensors, Reconnaissance, Amplifiers, Data conversion, Metals, Electro optics, Electrons

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Proceedings Article | 1 May 1994 Paper

High-frame-rate, motion-compensated 25.4 megapixel image sensor

Stacy Kamasz, Michael Farrier, Shing-Fat Ma, Robert Sabila, Savvas Chamberlain

Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172766

KEYWORDS: Clocks, Metals, Sensors, Image sensors, CCD image sensors, Resistance, Image segmentation, Capacitance, Sensor technology, Reconnaissance

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Proceedings Article | 1 May 1994 Paper

Characterization and modeling of CCD devices on high-resistivity silicon substrates

Stacy Kamasz, Michael Farrier, Charles Smith

Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172768

KEYWORDS: Charge-coupled devices, Photons, Silicon, Near infrared, Imaging systems, Visible radiation, X-rays, Electrons, Semiconducting wafers, X-ray imaging

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Proceedings Article | 20 December 1993 Paper

Megapixel image sensors with forward motion compensation for aerial reconnaissance applications

Michael Farrier, Stacy Kamasz, Shing-Fat Ma, William Washkurak, Savvas Chamberlain, P. Tom Jenkins

Proceedings Volume 2023, (1993) https://doi.org/10.1117/12.165518

KEYWORDS: Sensors, CCD image sensors, Image sensors, Reconnaissance, Clocks, Image segmentation, Charge-coupled devices, Airborne reconnaissance, Modulation transfer functions, Semiconducting wafers

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Proceedings Article | 15 November 1993 Paper

Megapixel CCD image sensors for aerial reconnaissance

Stacy Kamasz, Shing-Fat Ma, Michael Farrier, William Washkurak, Savvas Chamberlain, P. Tom Jenkins

Proceedings Volume 1952, (1993) https://doi.org/10.1117/12.161417

KEYWORDS: Sensors, Imaging systems, Image sensors, Airborne reconnaissance, CCD image sensors, Reconnaissance, Clocks, Reconnaissance systems, Charge-coupled devices, Yield improvement

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Proceedings Article | 12 July 1993 Paper

26.2-million-pixel CCD image sensor

Savvas Chamberlain, Stacy Kamasz, Shing-Fat Ma, William Washkurak, Michael Farrier, P. Tom Jenkins

Proceedings Volume 1900, (1993) https://doi.org/10.1117/12.148596

KEYWORDS: CCD image sensors, Amplifiers, Electrons, Image sensors, Charge-coupled devices, Clocks, Sensors, Transistors, Image resolution, Photography

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Showing 5 of 8 publications

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