Dr. Michael S. Sevegney
Sr. Engineer at SAMSUNG Austin Semiconductor LLC
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 March 2013 Paper
Proceedings Volume 8682, 86822A (2013) https://doi.org/10.1117/12.2011671
KEYWORDS: Semiconducting wafers, Particles, Chemical elements, Lithography, Silicon, Metrology, Microfluidics, Chemistry, Solids, Carbon

Proceedings Article | 19 March 2012 Paper
Toru Umeda, Shinichi Sugiyama, Takashi Nakamura, Makoto Momota, Michael Sevegney, Shuichi Tsuzuki, Toru Numaguchi
Proceedings Volume 8325, 83252H (2012) https://doi.org/10.1117/12.916026
KEYWORDS: Lithography, Radium, Manufacturing, Semiconducting wafers, Error analysis, Electronic filtering, Transducers, Inspection, Molecular interactions, Hydrogen

Proceedings Article | 1 April 2009 Paper
Michael Mesawich, Michael Sevegney, Barry Gotlinsky, Santos Reyes, Patrick Abbott, Jeremy Marzani, Mario Rivera
Proceedings Volume 7273, 72730O (2009) https://doi.org/10.1117/12.814374
KEYWORDS: Ozone, Particles, Optical lithography, Microfluidics, Manufacturing, Photoresist materials, Back end of line, Semiconductors, Bridges, Lithography

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