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Michael J. Tostanoski
Chief Engineer
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Publications (1)
Proceedings Article | 11 November 2002 Paper
TDAT: a test data analysis tool for near-real-time and batch processing of infrared focal plane data
Joseph Nonnast, Michael Tostanoski, Rudolf Goldflam
Proceedings Volume 4823, (2002) https://doi.org/10.1117/12.453518
KEYWORDS: Analytical research, Data analysis, Infrared radiation, Visible radiation, Data acquisition, Reconnaissance systems, Infrared imaging, Staring arrays, Electro-optic testing, Charge-coupled devices
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