Dr. Michele Riccio Profile

Dr. Michele Riccio

Research Fellow at Univ degli Studi di Napoli Federico II

SPIE Involvement:

Author

Area of Expertise:

Power Electronic , IGBT , Infrared , Reliability

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Publications (4)

Proceedings Article | 23 May 2023 Paper

Method for the interrogation of FBG thermo-hygrometer through full analog circuit

Vincenzo Romano Marrazzo, Francesco Fienga, Alfredo Zenga, Michele Riccio, Salvatore Buontempo, Andrea Irace, Giovanni Breglio

Proceedings Volume 12643, 1264332 (2023) https://doi.org/10.1117/12.2678305

KEYWORDS: Fiber Bragg gratings, Sensors, Arrayed waveguide gratings, Bragg wavelengths, Humidity, Temperature metrology, Analog electronics, Signal processing, Calibration

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Proceedings Article | 28 May 2013 Paper

Transmission line pulse system for avalanche characterization of high power semiconductor devices

Michele Riccio, Giovanni Ascione, Giuseppe De Falco, Luca Maresca, Martina De Laurentis, Andrea Irace, Giovanni Breglio

Proceedings Volume 8764, 87640U (2013) https://doi.org/10.1117/12.2017319

KEYWORDS: Switches, Capacitance, Device simulation, Semiconductors, Prototyping, Amplifiers, Microcontrollers, Manufacturing, Logic, Temperature metrology

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Because of the increasing in power density of electronic devices for medium and high power application, reliabilty of these devices is of great interest. Understanding the avalanche behaviour of a power device has become very important in these last years because it gives an indication of the maximum energy ratings which can be seen as an index of the device ruggedness. A good description of this behaviour is given by the static IV blocking characteristc. In order to avoid self heating, very relevant in high power devices, very short pulses of current have to be used, whose value can change from few milliamps up to tens of amps. The most used method to generate short pulses is the TLP (Transmission Line Pulse) test, which is based on charging the equivalent capacitance of a transmission line to high value of voltage and subsequently discharging it onto a load. This circuit let to obtain very short square pulses but it is mostly used for evaluate the ESD capability of semiconductor and, in this environment, it generates pulses of low amplitude which are not high enough to characterize the avalanche behaviour of high power devices . Advanced TLP circuit able to generate high current are usually very expensive and often suffer of distorption of the output pulse. In this article is proposed a simple, low cost circuit, based on a boosted-TLP configuration, which is capable to produce very square pulses of about one hundreds of nanosecond with amplitude up to some tens of amps. A prototype is implemented which can produce pulses up to 20A of amplitude with 200 ns of duration which can characterize power devices up to 1600V of breakdown voltage. Usage of microcontroller based logic make the circuit very flexible. Results of SPICE simulation are provided, together with experimental results. To prove the effectiveness of the circuit, the I-V blocking characteristics of two commercial devices, namely a 600V PowerMOS and a 1200V Trench-IGBT, are measured at different operating temperature.

Proceedings Article | 22 May 2013 Paper

Analysis of the Drever-Pound-Hall technique for the simultaneous detection of the detuning of more cavities on a single channel

Martina De Laurentis, Michele Riccio, Giuseppe De Falco, Luca Maresca, Andrea Irace, Giovanni Breglio

Proceedings Volume 8767, 876713 (2013) https://doi.org/10.1117/12.2017242

KEYWORDS: Sensors, Signal detection, Modulation, Magnetic sensors, Oscillators, Channel projecting optics, Refractive index, Interference (communication), Photodetectors, Polarization

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Proceedings Article | 6 May 2011 Paper

Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell

L. Maresca, M. De Laurentis, M. Riccio, A. Irace, G. Breglio

Proceedings Volume 8072, 807208 (2011) https://doi.org/10.1117/12.886803

KEYWORDS: Silicon photomultipliers, Avalanche photodetectors, Photodetectors, Quantum efficiency, Avalanche photodiodes, Ionization, Doping, TCAD, Signal detection, Absorption

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