Ms. Olga V. Pyatilova Profile

Olga V. Pyatilova

at MIET

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 30 December 2016 Paper

Study of morphological characteristic of por-Si formed using metal-assisted chemical etching by BET-method and fractal geometry

Anton Boyko, Olga Pyatilova, Rustam Kalmykov, Dahir Gaev, Sergei Timoshenkov, Sergei Gavrilov

Proceedings Volume 10224, 102240H (2016) https://doi.org/10.1117/12.2267147

KEYWORDS: Fractal analysis, Wet etching, Silicon, Scanning electron microscopy, Adsorption, Detection and tracking algorithms, Solids, Thermodynamics, Etching, Metals

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Proceedings Article | 30 December 2016 Paper

Metal-assisted chemical etching of silicon with different metal films and clusters: a review

O. Pyatilova, S. Gavrilov, A. Sysa, A. Savitskiy, A. Shuliatyev, A. Dudin, A. Pavlov

Proceedings Volume 10224, 1022405 (2016) https://doi.org/10.1117/12.2266862

KEYWORDS: Silicon, Metals, Wet etching, Silicon films, Nanostructuring, Detection and tracking algorithms, Silver, Etching, Nickel, Semiconducting wafers

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Proceedings Article | 30 December 2016 Paper

Investigation of the phase formation from nickel coated nanostructured silicon

Yulia Shilyaeva, Olga Pyatilova, Alexandra Yu. Berezkina, Artem Sysa, Alexander Dudin, Dmitry Smirnov, Sergey Gavrilov

Proceedings Volume 10224, 102240E (2016) https://doi.org/10.1117/12.2264593

KEYWORDS: Nickel, Nanostructuring, Silicon, Heat treatments, Chemical analysis, Plating, Diffraction, Statistical analysis, Metals, X-rays

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Proceedings Article | 18 December 2014 Paper

Reversible and non-reversible changes in nanostructured Si in humid atmosphere

V. Zhigalov, O. Pyatilova, S. Timoshenkov, S. Gavrilov

Proceedings Volume 9440, 94400B (2014) https://doi.org/10.1117/12.2180958

KEYWORDS: Humidity, Silicon, Nanostructuring, Chemisorption, Polishing, Scanning electron microscopy, Atmospheric physics, Etching, Molecules, Semiconducting wafers

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Proceedings Article | 18 December 2014 Paper

Nanostructured chalcogenide materials for memory switching devices

O. Pyatilova, S. Gavrilov, R. Rozanov, A. Zheleznyakova, A. Belov, V. Shevyakov

Proceedings Volume 9440, 944007 (2014) https://doi.org/10.1117/12.2179474

KEYWORDS: Thin films, Bismuth, Switching, Metals, Thin film deposition, Ions, Chalcogenides, Copper, Scanning electron microscopy, Atomic force microscopy

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