Single shot SPIFI operating in the Fourier Domain is demonstrated for the first time to our knowledge. We present initial results capturing Fourier Domain single shot images with both one and two-dimensional detectors and demonstrate that the same enhanced frequency support that is characteristic of classical SPIFI translates directly into single shot SPIFI architectures as well. Linear Fourier Domain single shot SPIFI is systematically analyzed, for both types of detectors. Finally, we show that despite the complex pulse structure imposed on the illumination beam by SPIFI, nonlinear single shot SPIFI can be realized, and third harmonic generation imaging is demonstrated. Prepared by LLNL under Contract DE-AC52-07NA27344. LLNL-ABS-860152.
Third harmonic generation (THG) microscopy offers label-free imaging and enables three-dimensional imaging with inherently good optical depth-sectioning. Its utility is important for imaging and characterization of laser-induced changes in transparent materials. Here we develop a digital twin for THG microscopy that allows accurate simulation of experiments and provides insight into desired information such as the third-order nonlinear susceptibility tensor. It also enables accurate simulation of the instrument's point spread function (PSF), which is essential for relating THG measurements to the desired hidden quantities. Finally, we improve microscope throughput with adaptive optics, demonstrating how PSF engineering improves spatial probing, temporal efficiency, and information content, and comparing results between the real setup and its digital twin.
Lately, the use of ultrafast in-volume laser-based processing of transparent materials has gained ground as a 3D-printing method of functional materials, photonics devices and high-density storage media. In this talk, we discuss the use of wide-field third-harmonic imaging that offers a non-destructive means for investigating and characterizing laser-written in-volume complex structures. Specifically, the method is used for identifying laser-induced modifications and establishing their taxonomy over a large area of a material. Unlike confocal arrangements, its ability to capture both the direct and scattered signal enables the collection of comprehensive information related to the local laser-induced modifications. Its inline nature allows for in situ monitoring of the material's response to various laser exposure conditions. As future prospect, it offers a pathway towards the implementation of closed-loop control algorithms, guaranteeing the accuracy and consistency of the desired modifications.
Spatial frequency modulated imaging (SPIFI) employs a structured line-shaped illumination, able to resolve beyond conventional resolution limits for coherent light with high speed. It produces image harmonics, with each order carrying a higher resolution. To date this method used rotating reticles to produce the necessary structured illumination, limiting image acquisition to about 100 μs. Here, we introduce a single-shot approach. We show that a super-resolved 1D image can be acquired with a single femtosecond pulse, with potential acquisition rates in the tens of kHz.
In this contribution, we compare the etching behaviour of fused silica machined with a femtosecond laser at three different wavelengths. We use a high-power YAG laser to generate 450 fs-long pulses at the first (1030 nm) and third (343 nm) harmonic. We demonstrate how these new machining techniques can be used to improve the laser-assisted etching in fused silica not only in terms of etching speed, but also in terms of minimal feature size and surface roughness. Processing speeds of several 100 mm/s become possible due to the new regime using fs-UV light.
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