Prof. Patricia M. Nieva
Associate Professor at Univ of Waterloo
SPIE Involvement:
Author
Area of Expertise:
Optical Fiber Sensors , Micro and Nano Sensors , Micro and Nano Fabrication , Localized Surface Plasmon Resonance Sensors , Evanescent Wave Sensors , Micro and Nano Materials Characterization
Websites:
Profile Summary

Dr. Patricia Nieva received her Bachelor Degree in Mechanical and Electrical Engineering in the Universidad Nacional de Ingenieria, Lima, Peru. She received her M.Sc. degree in Mechanical Engineering and Ph.D. degree in Electrical Engineering from Northeastern University, Massachusetts, USA. She is currently an Associate Professor in the Department of Mechanical and Mechatronics Engineering and the Director of the Sensors and Integrated Microsystems Laboratory at the University of Waterloo, Canada. Her main research goal is the use of micro and nanotechnology to design microsensors, nanosensors and integrated systems solutions, particularly for harsh environment sensing, point-of-care health monitoring and medical diagnosis. Her work also spans reliability studies and in-situ characterization of material properties of thin films used in the manufacturing of N/MEMS. Dr Nieva’s ongoing research work constitutes an important commitment to the identification of simple, cost-effective and reliable technologies for advanced sensing.
Publications (15)

Proceedings Article | 7 March 2014 Paper
L. Zdravkova, P. Nieva
Proceedings Volume 8980, 898023 (2014) https://doi.org/10.1117/12.2040966
KEYWORDS: Refractive index, Cladding, Fiber optics sensors, Waveguides, Finite-difference time-domain method, Fiber optics, Sensors, Wave sensors, Electromagnetism, Optical fibers

Proceedings Article | 7 March 2014 Paper
Proceedings Volume 8977, 89770M (2014) https://doi.org/10.1117/12.2040728
KEYWORDS: Gold, Actuators, Silicon, Computer aided design, Temperature metrology, Metals, Micromirrors, Computer simulations, Mirrors, Optical lithography

Proceedings Article | 7 March 2014 Paper
R. Norris, K. Iyer, V. Chabot, P. Nieva, A. Yu, A. Khajepour, J. Wang
Proceedings Volume 8982, 898214 (2014) https://doi.org/10.1117/12.2040655
KEYWORDS: Electrodes, System on a chip, Absorbance, Lithium, FT-IR spectroscopy, Reflectivity, Ions, Optical properties, Spectroscopy, Attenuated total reflectance

Proceedings Article | 7 March 2014 Paper
Proceedings Volume 8980, 898008 (2014) https://doi.org/10.1117/12.2040366
KEYWORDS: Cladding, FT-IR spectroscopy, Light emitting diodes, Reflection, Interfaces, Thin films, Sensors, Geometrical optics, LED lighting, Refraction

SPIE Journal Paper | 26 July 2013
Ryan Denomme, Krishna Iyer, Michael Kreder, Brendan Smith, Patricia Nieva
JM3, Vol. 12, Issue 03, 031106, (July 2013) https://doi.org/10.1117/12.10.1117/1.JMM.12.3.031106
KEYWORDS: Photoresist materials, Nanoparticles, Silver, Lithography, Sensors, Metals, Nanolithography, Photomasks, Optical lithography, Semiconducting wafers

Showing 5 of 15 publications
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