Dr. Patrick Gailly
at Ctr Spatial de Liège
SPIE Involvement:
Author
Area of Expertise:
Ion Beam Figuring , ion beam texturing , sputtering , laser micromachining
Websites:
Publications (11)

Proceedings Article | 12 July 2023 Open Access Paper
Jérôme Jacobs, Jean-Yves Plesseria, Felix Althaus, Thomas Beck, Pierre Franco, Patrick Gailly, Dimce Iliev, Sylvain Keller, Etienne Lallemand, Bao Long Levan, Alexandra Mazzoli, Laurence Rossi, Augustin Thomas, Nicolas Thomas, Christoph Zimmermann, Christian Kintziger
Proceedings Volume 12777, 127775D (2023) https://doi.org/10.1117/12.2691005
KEYWORDS: Mirrors, Shape memory alloys, Comets, Design and modelling, Coating, Particles, Space operations, Baffles, Astronomical imaging, Interfaces

Proceedings Article | 1 April 2020 Presentation + Paper
J. Hastanin, C. Lenaerts, P. Gailly, F. Rabecki, A. Roobroeck, S. Desprez, D. Bernier, F. Dortu, C. Dekuijper, D. Lanterbecq, K. Lecointe, B. Sendid, M. Bouazaoui, S. Maricot, M.-T. Bakouche, S. Ganesan, J.-P. Vilcot, K. Fleury-Frenette
Proceedings Volume 11361, 113610P (2020) https://doi.org/10.1117/12.2553216
KEYWORDS: Sensors, Refractive index, Microfluidics, Molecules, Biosensing, Plasmonics, Biological research

Proceedings Article | 21 November 2017 Open Access Paper
P. Gailly, J.-P. Collette, K. Fleury Frenette, C. Jamar
Proceedings Volume 10568, 105681G (2017) https://doi.org/10.1117/12.2308012
KEYWORDS: Ion beam finishing, Ions, Ion beams, Mirrors, Etching, Silicon carbide, Chemical vapor deposition, Xenon, Krypton, Argon

Proceedings Article | 27 April 2016 Paper
J. Hastanin, C. Lenaerts, P. Gailly, H. Jans, C. Huang, L. Lagae, D. Kokkinos, K. Fleury-Frenette
Proceedings Volume 9887, 988726 (2016) https://doi.org/10.1117/12.2227090
KEYWORDS: Microfluidics, Biosensing, Biological research, Internet, Medicine, Diagnostics, Software development, Mobile devices, Tablets, Capillaries, Liquids, Refractive index, Prisms, Gold, Prototyping, Molecules

Proceedings Article | 2 May 2012 Paper
P. Gailly, J. Hastanin, C. Duterte, Y. Hernandez, J.-B. Lecourt, A. Kupisiewicz, P.-E. Martin, K. Fleury-Frenette
Proceedings Volume 8438, 84381F (2012) https://doi.org/10.1117/12.922576
KEYWORDS: Thin films, Semiconductor lasers, Pulsed laser operation, Temperature metrology, Finite-difference time-domain method, Metrology, Reflectivity, Nickel, Semiconductors, Thin film solar cells

Showing 5 of 11 publications
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