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Dr. Patrick J. Moyer
Associate Professor at Univ of North Carolina at Charlotte
SPIE Involvement:
Author
Publications (4)
SPIE Journal Paper | 1 January 2004
Multimode interference switch design with loose manufacturing tolerance
Patrick Moyer, Stephen Pridmore, Faramarz Farahi
OE, Vol. 43, Issue 01, (January 2004) https://doi.org/10.1117/12.10.1117/1.1626668
KEYWORDS: Switches, Electrodes, Waveguides, Brain-machine interfaces, Multimode interference devices, Tolerancing, Photonic integrated circuits, Refraction, Manufacturing, Optical switching
Proceedings Article | 17 January 2003 Paper
Applications of spin-on glass for waveguide and micro-optical systems
Proceedings Volume 4984, (2003) https://doi.org/10.1117/12.477859
KEYWORDS: Waveguides, Switches, Electrodes, Brain-machine interfaces, Photonic integrated circuits, Cladding, Glasses, Multimode interference devices, Refraction, Optical design
Proceedings Article | 4 June 1993 Paper
Reflection shear force/reflection near-field scanning optical microscopy
Patrick Moyer, Michael Paesler
Proceedings Volume 1855, (1993) https://doi.org/10.1117/12.146363
KEYWORDS: Near field scanning optical microscopy, Raman spectroscopy, Near field optics, Scanning probe microscopy, Signal detection, Ferroelectric materials, Diffraction, Raman scattering, Image analysis, Image quality
Proceedings Article | 1 May 1992 Paper
Resolution issues in scanning optical microscopies
Eric Buckland, Patrick Moyer, Michael Paesler
Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58171
KEYWORDS: Near field scanning optical microscopy, Scattering, Spatial resolution, Signal detection, Imaging systems, Image resolution, Optical transfer functions, Metals, Near field optics, Scanning probe microscopy
Proceedings Volume Editor (1)
SPIE Conference Volume | 6 September 1995
Near-Field Optics
Conference Committee Involvement (1)
Near-Field Optics
9 July 1995 | San Diego, CA, United States
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