Prof. Ping Fan Profile

Prof. Ping Fan

at Shanghai Institute of Optics and Fine Mechanics

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Author

Publications (5)

Proceedings Article | 8 July 2019 Paper

Employing Ni-Cr co-doping to prepare low phase transition temperature VO2 film

Qicong He, Dongping Zhang, Ying Huang, Yu Yang, Huan Guan, Jingcheng Jin, Ping Fan

Proceedings Volume 11064, 110640G (2019) https://doi.org/10.1117/12.2541404

KEYWORDS: Doping, Thin films, Transmittance, Annealing, Infrared radiation, Sputter deposition, Phase shift keying, Silicon

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Proceedings Article | 8 July 2019 Paper

Thickness dependence of Cr-doped VO2 thin films deposition by reactive pulsed magnetron sputtering

Huan Guan, Dongping Zhang, Jingcheng Jin, Yu Yang, Yi Huang, Qicong He, Ping Fan

Proceedings Volume 11064, 1106403 (2019) https://doi.org/10.1117/12.2540082

KEYWORDS: Transmittance, Thin films, Infrared radiation, Modulation, Doping, Solar energy, Sputter deposition, Vanadium, Chromium, Crystals

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Proceedings Article | 29 August 2013 Paper

Real-time measurement with a fiber optical surface plasmon resonance sensor for biochemical interaction analysis

Zhixin Tan, Xuejin Li, Yuzhi Chen, Ping Fan

Proceedings Volume 8914, 891406 (2013) https://doi.org/10.1117/12.2031813

KEYWORDS: Sensors, Fiber optics sensors, Surface plasmons, Biological research, Software development, Water, Spectroscopy, Data processing, Refractive index, Fiber optics

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Proceedings Article | 14 November 2007 Paper

Comparison of ion post treatment and laser conditioning of thin films

Dongping Zhang, Ping Fan, Xing-Min Cai, Jianda Shao, Zhengxiu Fan

Proceedings Volume 6722, 67221Q (2007) https://doi.org/10.1117/12.783020

KEYWORDS: Thin films, Ions, Absorption, Laser induced damage, Laser damage threshold, Ion lasers, Laser optics, Laser energy, Plasma, Chemical species

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Proceedings Article | 8 December 2004 Paper

The characteristic criterion of the growth of metallic films from discontinuous to continuous

Ping Fan, Hong-Ji Qi, Kui Yi, Jian-Da Shao, Zheng-Xiu Fan

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607271

KEYWORDS: Copper, Thin films, Metals, Atomic force microscopy, Glasses, Gold, Platinum, Ions, Nickel, Ion beams

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