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QianYing Tang
at Univ of California Berkeley
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Author
Publications (4)
Proceedings Article | 13 March 2009 Paper
Interval-value based circuit simulation for statistical circuit design
Proceedings Volume 7275, 72750J (2009) https://doi.org/10.1117/12.814262
KEYWORDS: Monte Carlo methods, Device simulation, Computer simulations, Transistors, Process modeling, Statistical modeling, Statistical analysis, Error analysis, Performance modeling, Instrument modeling
Proceedings Article | 4 March 2008 Paper
Layout optimization based on a generalized process variability model
Proceedings Volume 6925, 69250F (2008) https://doi.org/10.1117/12.772882
KEYWORDS: Transistors, Process modeling, Optimization (mathematics), Semiconducting wafers, Diffusion, Instrument modeling, Monte Carlo methods, Computer programming, Lithography, Manufacturing
Proceedings Article | 21 March 2007 Paper
Circuit size optimization with multiple sources of variation and position dependant correlation
Proceedings Volume 6521, 65210P (2007) https://doi.org/10.1117/12.711794
KEYWORDS: Transistors, Performance modeling, Semiconducting wafers, Monte Carlo methods, Instrument modeling, Statistical modeling, Distance measurement, Computer programming, Device simulation, Capacitance
Proceedings Article | 21 March 2007 Paper
Modeling spatial gate length variation in the 0.2µm to 1.15mm separation range
Paul Friedberg, Willy Cheung, George Cheng, Qian Ying Tang, Costas Spanos
Proceedings Volume 6521, 652119 (2007) https://doi.org/10.1117/12.710668
KEYWORDS: Critical dimension metrology, Molybdenum, Manufacturing, Monte Carlo methods, Structural design, Etching, Metrology, Process control, Lithography, Resistance
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