Prof. Qingchuan Zhang Profile

Prof. Qingchuan Zhang

at Univ of Science & Technology of China

SPIE Involvement:

Author

SPIE Journal Paper | 4 May 2018

High-accuracy three-dimensional shape measurement of micro solder paste and printed circuits based on digital image correlation

Xian Zhang, Yong Su, Zeren Gao, Tan Xu, Xiaohua Ding, Qifeng Yu, Qingchuan Zhang

OE, Vol. 57, Issue 05, 054101, (May 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.5.054101

KEYWORDS: 3D image processing, Cameras, Digital image correlation, Calibration, 3D image reconstruction, 3D metrology, Speckle pattern, Digital electronics, Digital electronic circuits, Distortion

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Proceedings Article | 19 October 2016 Paper

Random errors in DIC caused by non-uniform image noise

Yong Su, Qingchuan Zhang

Proceedings Volume 10155, 1015503 (2016) https://doi.org/10.1117/12.2243571

KEYWORDS: Digital image correlation, Optical testing

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Proceedings Article | 18 September 2014 Paper

Research of infrared image optimization algorithm in optical read-out IR imaging

Jianxiong Wu, Teng Cheng, Qingchuan Zhang, Jie Gao, Xiaoping Wu

Proceedings Volume 9282, 92821P (2014) https://doi.org/10.1117/12.2068041

KEYWORDS: Infrared imaging, Thermography, Staring arrays, Image fusion, Image restoration, Infrared radiation, Image enhancement, Image processing, Superposition, Diffusion

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SPIE Journal Paper | 14 October 2013

Wave-plate phase shifting method

Zhigang Zhang, Qingchuan Zhang, Teng Cheng, Jie Gao, Xiaoping Wu

OE, Vol. 52, Issue 10, 103109, (October 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.10.103109

KEYWORDS: Phase shifting, Charge-coupled devices, Digital holography, Polarization, Numerical simulations, Phase measurement, Polarizers, 3D image reconstruction, Image quality, Beam splitters

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Proceedings Article | 22 June 2013 Paper

3D digital image correlation investigation of PLC effect in a new Ni–Co base superalloy

Y. Gao, S. Fu, T. Cheng, X. Huo, Q. Zhang

Proceedings Volume 8769, 87691O (2013) https://doi.org/10.1117/12.2019066

KEYWORDS: Digital image correlation, Photonic integrated circuits, 3D metrology, 3D image processing, Temperature metrology, Cameras, Nickel, Computing systems, Aluminum, Phase modulation

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Proceedings Article | 30 December 2004 Paper

Fabrication and application of a novel freestanding stencil bi-material cantilever structure

Weibing Wang, Dapeng Chen, Tianchun Ye, Liang Pan, Qingchuan Zhang, Xiaoping Wu

Proceedings Volume 5641, (2004) https://doi.org/10.1117/12.569916

KEYWORDS: Infrared imaging, Microelectromechanical systems, Thermography, Gold, Imaging systems, Silicon, Staring arrays, Scanning electron microscopy, Infrared radiation, Sensors

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Proceedings Article | 29 April 2003 Paper

Investigation of propagation and pulsation of slip band using dynamic DSPI

Qingchuan Zhang, Xiaoping Wu

Proceedings Volume 5058, (2003) https://doi.org/10.1117/12.509762

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Proceedings Article | 29 April 2003 Paper

Investigation of Portevin-Le Chatelier band with temporal phase analysis of speckle interferometry

Zhenyu Jiang, Qingchuan Zhang, Xiaoping Wu

Proceedings Volume 5058, (2003) https://doi.org/10.1117/12.509767

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Proceedings Article | 29 May 2002 Paper

Propagation and pulsation of slip band using dynamic digital speckle pattern interferometry

Qing-Chuan Zhang, Satoru Toyooka, Xiaoping Wu

Proceedings Volume 4537, (2002) https://doi.org/10.1117/12.468785

KEYWORDS: Fringe analysis, Speckle pattern, Aluminum, Interferometry, Photonic integrated circuits, Atmospheric propagation, Chemical species, Polishing, Image processing, Metals

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Proceedings Article | 13 June 2001 Paper

Analysis of wavy propagation of plastic deformation field by dynamic ESPI

Satoru Toyooka, Rini Widiastuti, Qing-Chuan Zhang

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429557

KEYWORDS: Speckle pattern, Fringe analysis, Statistical analysis, Aluminum, Speckle, Surface finishing, CCD cameras, Data acquisition, Phase shifting, Wave propagation

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Proceedings Article | 8 May 2001 Paper

Dynamic measurement of plastic deformation field by ESPI

Satoru Toyooka, Qing-Chuan Zhang, V. Madjarova, - Suprapedi, Rini Widiastuti

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427024

KEYWORDS: Speckle, Interferometry, Fringe analysis, Speckle pattern, Aluminum, Camera shutters, Analytical research, Phase measurement, Charge-coupled devices, CCD cameras

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Proceedings Article | 8 May 2001 Paper

In-situ observation of tensile experiments on austenitic stainless steel by ESPI

Manabu Tominaga, Satoru Toyooka, Hisanori Taniyama, Qing-Chuan Zhang

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427023

KEYWORDS: Speckle pattern, Fringe analysis, Carbon, Diagnostics, Mirrors, Interferometry, YAG lasers, CCD cameras, Mechanical engineering, Solids

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Proceedings Article | 8 February 1999 Paper

Slipband propagation in aluminum alloy with dynamic speckle interferometry

Qing-Chuan Zhang, Satoru Toyooka, Zhaobin Meng, - Suprapedi

Proceedings Volume 3585, (1999) https://doi.org/10.1117/12.339871

KEYWORDS: Fringe analysis, Speckle pattern, Aluminum, CCD cameras, Speckle interferometry, Image processing, Computer programming, Metals, Polishing, Time metrology

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Proceedings Article | 29 September 1998 Paper

Speckle interferometry to investigate degradation processes of stressed solid materials

Satoru Toyooka, - Suprapedi, Qing-Chuan Zhang

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323346

KEYWORDS: Speckle pattern, Speckle interferometry, Aluminum, Fringe analysis, Speckle, Carbon, Solids, Mirrors, Image processing, Beam splitters

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Proceedings Article | 25 September 1996 Paper

Double-band infrared image processing system using rosette scanning

Haifeng Wan, Zhi Liang, Qingchuan Zhang , Xinzhi Su

Proceedings Volume 2894, (1996) https://doi.org/10.1117/12.252090

KEYWORDS: Infrared radiation, Infrared imaging, Target recognition, Infrared detectors, Target detection, Image processing, Sensors, Infrared sensors, Mirrors, Head

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Showing 5 of 15 publications

Conference Committee Involvement (3)

Optoelectronic Imaging and Multimedia Technology II

5 November 2012 | Beijing, China

Optical Metrology and Inspection for Industrial Applications II

5 November 2012 | Beijing, China

Optoelectronic Imaging and Multimedia Technology

18 October 2010 | Beijing, China

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