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Raúl Fernandez
at Univ Autònoma de Barcelona
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Publications (1)
Proceedings Article | 30 June 2005 Paper
Ring oscillator behavior after oxide breakdown
R. Fernandez, R. Rodriguez, M. Nafria, X. Aymerich
Proceedings Volume 5837, (2005) https://doi.org/10.1117/12.608245
KEYWORDS: Oxides, Oscillators, Transistors, Field effect transistors, Device simulation, Measurement devices, Reliability, Instrument modeling, Systems modeling, Dielectric breakdown
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