Dr. René Schödel Profile

Dr. René Schödel

Head of Department at Physikalisch-Technische Bundesanstalt

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Publications (9)

Proceedings Article | 2 September 2015 Paper

State-of-the-art cryogenic CTE measurements of ultra-low thermal expansion materials

Thomas Middelmann, Alexander Walkov, René Schödel

Proceedings Volume 9574, 95740N (2015) https://doi.org/10.1117/12.2187928

KEYWORDS: Temperature metrology, Silicon carbide, Silicon, Cryogenics, Ceramics, Interferometers, Crystals, Space telescopes, Mirrors, Beam splitters

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Proceedings Article | 27 August 2014 Paper

Interferometric measurement of dimensional and thermal stability of joints

Hagen Lorenz, René Schödel

Proceedings Volume 9173, 91730B (2014) https://doi.org/10.1117/12.2060382

KEYWORDS: Adhesives, Interferometry, Interfaces, Temperature metrology, Glasses, Epoxies, Calibration, Silicon, Humidity, Neodymium

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Proceedings Article | 12 January 2009 Paper

High accuracy measurements of long-term stability of material with PTB's Precision Interferometer

R. Schödel, A. Abou-Zeid

Proceedings Volume 7133, 71333J (2009) https://doi.org/10.1117/12.809987

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Proceedings Article | 27 August 2005 Paper

Investigation of thermal expansion homogeneity by optical interferometry

R. Schodel

Proceedings Volume 5858, 58580Q (2005) https://doi.org/10.1117/12.612582

KEYWORDS: Interferometers, Temperature metrology, Zerodur, Interferometry, Optical interferometry, Phase interferometry, Light sources, Autocollimation, Cameras, Refractive index

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Proceedings Article | 24 August 2005 Paper

Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurements

R. Schoedel

Proceedings Volume 5879, 587901 (2005) https://doi.org/10.1117/12.616923

KEYWORDS: Solids, Lithium, Temperature metrology, Interferometry, Precision measurement, Data modeling, Interferometers, Phase interferometry, Tungsten, Crystals

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Proceedings Article | 2 August 2004 Paper

Methods to recognize the sample position for most precise interferometric length measurements

Rene Schoedel, Jennifer Decker

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.555835

KEYWORDS: Interferometry, Temperature metrology, Edge detection, Interferometers, Cameras, Data corrections, Phase interferometry, Autocollimation, Pixel resolution, Laser stabilization

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Proceedings Article | 20 November 2003 Paper

Minimizing interferometer misalignment errors for measurement of subnanometer length changes

Rene Schoedel, Arnold Nicolaus, Gerhard Boensch

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503677

KEYWORDS: Interferometers, Autocollimation, Collimators, Mirrors, Solids, Temperature metrology, Multimode fibers, Interferometry, Laser stabilization, Cameras

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Proceedings Article | 20 November 2003 Paper

Next-generation Kösters interferometer

Jennifer Decker, Rene Schodel, Gerhard Bonsch

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503565

KEYWORDS: Interferometers, Calibration, Diffraction, Prisms, Refractive index, Phase shifts, Phase measurement, Mirrors, Interferometry, Temperature metrology

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Proceedings Article | 22 October 2001 Paper

Precise interferometric measurements at single-crystal silicon yielding thermal expansion coefficients from 12 deg to 28 degC and compressibility

Rene Schoedel, Gerhard Boensch

Proceedings Volume 4401, (2001) https://doi.org/10.1117/12.445624

KEYWORDS: Silicon, Crystals, Temperature metrology, Interferometry, Interferometers, Refractive index, Cameras, Ultrasonics, Crystallography, Protactinium

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Showing 5 of 9 publications

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