Dr. Robert D. Fiete
Chief Technologist, Senior Fellow at L3Harris Technologies Inc
SPIE Involvement:
Author | Instructor
Area of Expertise:
Image Chain Modeling , Imaging System Design , Image Processing
Publications (13)

SPIE Journal Paper | 2 January 2017
OE, Vol. 56, Issue 01, 013102, (January 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.1.013102
KEYWORDS: Signal to noise ratio, Sensors, Sensor performance, Image quality, Modulation transfer functions, Quantum efficiency, Remote sensing, Optical engineering, Photography, Electro optical modeling

Proceedings Article | 13 May 2015 Paper
Proceedings Volume 9483, 94830U (2015) https://doi.org/10.1117/12.2178512
KEYWORDS: Sensors, Imaging systems, Terahertz radiation, Antennas, Solids, CMOS technology, Standoff detection, Signal detection, Raster graphics, Interference (communication)

SPIE Journal Paper | 18 August 2014 Open Access
OE, Vol. 53, Issue 08, 083103, (August 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.8.083103
KEYWORDS: Point spread functions, Optical transfer functions, Imaging systems, Sensors, Image quality, Cameras, Wavefronts, Mathematical modeling, Modulation transfer functions, Optical engineering

Proceedings Article | 21 May 2014 Paper
Proceedings Volume 9102, 91020Q (2014) https://doi.org/10.1117/12.2050906
KEYWORDS: Antennas, Imaging systems, Terahertz radiation, Silicon, Sensors, Optical design, Field effect transistors, Near field, CMOS sensors, Imaging spectroscopy

Proceedings Article | 31 May 2013 Paper
J. Daniel Newman, Paul Lee, Andrew Sacco, Thomas Chamberlain, Dave Willems, Robert Fiete, Mark Bocko, Zeljko Ignotovic, Judith Pipher, Craig McMurtry, Xi-Cheng Zhang, David Rhodes, Zoran Ninkov
Proceedings Volume 8716, 87160A (2013) https://doi.org/10.1117/12.2014932
KEYWORDS: Terahertz radiation, Sensors, Imaging systems, Antennas, Signal to noise ratio, Signal detection, CMOS sensors, Plasmonics, Staring arrays, Systems modeling

Showing 5 of 13 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 31 October 2000

SPIE Conference Volume | 31 October 2000

Conference Committee Involvement (18)
Imaging Spectrometry XXVI: Applications, Sensors, and Processing
22 August 2023 | San Diego, California, United States
Imaging Spectrometry XXV: Applications, Sensors, and Processing
22 August 2022 | San Diego, California, United States
Imaging Spectrometry XXIV: Applications, Sensors, and Processing
24 August 2020 | Online Only, California, United States
Imaging Spectrometry XXIII: Applications, Sensors, and Processing
11 August 2019 | San Diego, California, United States
Imaging Spectrometry XXII: Applications, Sensors, and Processing
20 August 2018 | San Diego, California, United States
Showing 5 of 18 Conference Committees
Course Instructor
SC959: Image Chain Modeling of Digital Camera Systems
Image chain modeling has become an important systems engineering tool for assessing the design of imaging systems. By mathematically modeling the image formation process of the entire imaging chain, from the radiometric source to the delivered image data, various imaging system designs can be studied and analyzed to optimize the image quality and assure that the final system design will meet the user's requirements. Images can be created and evaluated from the camera design before the camera is built, thus preventing costly redesigns after hardware has been purchased and integrated. This course presents an overview of the image chain models for digital imaging systems and the application of the models to quantify image quality differences between various design concepts. A discussion of the key elements of an imaging chain will be presented with discussion of the mathematical tools, such as linear systems math, used to model the imaging chain.
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