Dr. Roger Durst
Chief Technology Officer at Bruker AXS GmbH
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 1 September 2021 Presentation + Paper
B. Becker, J. Kaercher, M. Krug, S. Leo, T. Stuerzer, B. Weinhausen, R. Durst
Proceedings Volume 11838, 118380N (2021) https://doi.org/10.1117/12.2597029
KEYWORDS: Sensors, X-rays, Photon counting, X-ray detectors, Photodetectors, X-ray diffraction, Signal detection, Scintillators

Proceedings Article | 31 March 2016 Paper
Hao Jiang, Joerg Kaercher, Roger Durst
Proceedings Volume 9783, 97833P (2016) https://doi.org/10.1117/12.2217115
KEYWORDS: X-rays, Digital breast tomosynthesis, Signal to noise ratio, X-ray imaging, Imaging systems, Scintillators, Mammography, Breast, Single photon, Electrons, Sensors, CMOS sensors, X-ray detectors, Interference (communication)

Proceedings Article | 28 September 2011 Paper
T. He, R. Durst, B. Becker, J. Kaercher, G. Wachter
Proceedings Volume 8142, 81421Q (2011) https://doi.org/10.1117/12.899721
KEYWORDS: Imaging systems, Sensors, CMOS sensors, Cameras, X-rays, Electrons, X-ray imaging, Calibration, Quantum efficiency, Analog electronics

Proceedings Article | 28 January 2004 Paper
David Khazins, Bruce Becker, Bob He, Yacouba Diawara, Roger Durst, Sergei Medved, Vlad Sedov, Tim Thorson
Proceedings Volume 5194, (2004) https://doi.org/10.1117/12.505184
KEYWORDS: Sensors, Spatial resolution, X-rays, X-ray detectors, X-ray diffraction, Electrodes, Amplifiers, Diffraction, Electronics, Resistance

Proceedings Article | 20 January 2004 Paper
Timothy Thorson, Roger Durst, Dan Frankel, Rex Bordwell, Jose Camara, Edward Leon-Guerrero, Steven Onishi, Francis Pang, Paul Vu, Edwin Westbrook
Proceedings Volume 5198, (2004) https://doi.org/10.1117/12.505710
KEYWORDS: Electronics, Imaging systems, Electrons, CCD image sensors, Back illuminated sensors, CCD cameras, X-ray diffraction, Sensors, Charge-coupled devices, Cameras

Showing 5 of 8 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 10 January 2003

SPIE Conference Volume | 10 January 2003

Conference Committee Involvement (2)
X-Ray and Gamma-Ray Detectors and Applications IV
8 July 2002 | Seattle, WA, United States
X-Ray Detectors
7 July 2002 | Seattle, WA, United States
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