Dr. Russell A. Crook
EO-IR and Spacecraft Systems
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 1 May 2006
OE, Vol. 45, Issue 05, 059001, (May 2006) https://doi.org/10.1117/12.10.1117/1.2205782
KEYWORDS: Particles, Contamination, Spherical lenses, Autoregressive models, Inspection, Data modeling, Optical engineering, Reflectivity, Stray light, Failure analysis

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