Ryuichi Saito
at Toshiba Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 March 2017 Presentation + Paper
Seiji Morita, Ryuichi Saito, Ryosuke Yamamoto, Norikatsu Sasao, Tomoaki Sawabe, Koji Asakawa, Shinobu Sugimura
Proceedings Volume 10144, 101440R (2017) https://doi.org/10.1117/12.2257987
KEYWORDS: Lithography, Dry etching, Immersion lithography, Annealing, Resistance, Double patterning technology, Molecular self-assembly, Optical lithography, Scanning electron microscopy, Organic materials, Directed self assembly, Semiconducting wafers, Reactive ion etching, Metals

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