Mr. Sai Swaroop Yeddulapalli Profile

Sai Swaroop Yeddulapalli

at Texas A&M Univ.

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Publications (3)

SPIE Journal Paper | 29 April 2019

Line roughness estimation and Poisson denoising in scanning electron microscope images using deep learning

Narendra Chaudhary, Serap Savari, Sai Yeddulapalli

JM3, Vol. 18, Issue 02, 024001, (April 2019) https://doi.org/10.1117/12.10.1117/1.JMM.18.2.024001

KEYWORDS: Scanning electron microscopy, Neural networks, Line width roughness, Denoising, Line edge roughness, Machine learning, Monte Carlo methods, Computer simulations, Convolutional neural networks, Wavelets

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Proceedings Article | 3 October 2018 Paper

Automated rough line-edge estimation from SEM images using deep convolutional neural networks

Narendra Chaudhary, Serap Savari, S. S. Yeddulapalli

Proceedings Volume 10810, 108101L (2018) https://doi.org/10.1117/12.2501723

KEYWORDS: Scanning electron microscopy, Convolutional neural networks, Line edge roughness, Machine learning, Line width roughness, Image processing, Neural networks, Stochastic processes

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Proceedings Article | 19 September 2018 Paper

Deep supervised learning to estimate true rough line images from SEM images

Narendra Chaudhary, Serap Savari, S. S. Yeddulapalli

Proceedings Volume 10775, 107750R (2018) https://doi.org/10.1117/12.2324341

KEYWORDS: Neural networks, Scanning electron microscopy, Line width roughness, Machine learning, Denoising, Line edge roughness, Stochastic processes, Convolutional neural networks

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