Dr. Sangcheol Kim Profile

Dr. Sangcheol Kim

at National Institute of Standards and Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 25 March 2008 Paper

Hae-Jeong Lee, Sangcheol Kim, Christopher Soles, Eric Lin, Wen-Li Wu

Proceedings Volume 6922, 692224 (2008) https://doi.org/10.1117/12.772849

KEYWORDS: X-rays, Polymers, Reflectivity, Metrology, Data modeling, Silicon, Picosecond phenomena, X-ray sources, Thin films, Scattering

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases