Sarah Schneider
at AIT Austrian Institute of Technology GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 March 2022 Poster + Paper
Nicole Brosch, Laurin Ginner, Sarah Schneider, Doris Antensteiner, Lukas Traxler
Proceedings Volume 12019, 120190P (2022) https://doi.org/10.1117/12.2605273
KEYWORDS: Inspection, Machine learning, Translucency, Defect detection, Statistical analysis, Data processing, Data modeling

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