Mr. Sebastian Schlichting Profile

Sebastian Schlichting

at Laser Zentrum Hannover eV

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 22 March 2018 Paper

Approaches toward optimized laser-induced damage thresholds of dispersive compensating mirrors applying nanolaminates

T. Willemsen, M. Brinkmann, M. Jupé, M. Gyamfi, S. Schlichting, D. Ristau

Proceedings Volume 10447, 1044712 (2018) https://doi.org/10.1117/12.2281126

KEYWORDS: Mirrors, Refractive index, Dielectrics, Laser damage threshold, Optics manufacturing, Quantum wells

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Proceedings Article | 6 December 2016 Paper

Improved LIDT values for dielectric dispersive compensating mirrors applying ternary composites

T. Willemsen, S. Schlichting, M. Gyamfi, M. Jupé, H. Ehlers, U. Morgner, D. Ristau

Proceedings Volume 10014, 100141Z (2016) https://doi.org/10.1117/12.2244835

KEYWORDS: Composites, Mirrors, Dielectrics, Dielectric mirrors, Curium, Tantalum, Laser damage threshold, Reverse engineering, Laser induced damage, Detection and tracking algorithms

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Proceedings Article | 23 September 2015 Paper

Direct in situ GDD measurement in optical coating process

S. Schlichting, T. Willemsen, H. Ehlers, U. Morgner, D. Ristau

Proceedings Volume 9627, 96271S (2015) https://doi.org/10.1117/12.2191215

KEYWORDS: In situ metrology, Mirrors, Coating, Optical coatings, Spectroscopy, Light sources, Interferometry, Optical testing, Michelson interferometers, Algorithm development

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Proceedings Article | 23 September 2015 Paper

Precise fabrication of ultra violet dielectric dispersion compensating mirrors

T. Willemsen, S. Schlichting, T. Kellermann, M. Jupé, H. Ehlers, U. Morgner, D. Ristau

Proceedings Volume 9627, 96271U (2015) https://doi.org/10.1117/12.2191051

KEYWORDS: Ultraviolet radiation, Mirrors, Near infrared, In situ metrology, Reflectivity, Dielectric dispersion, Dielectric mirrors, Spectroscopy, Solids, Silica

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Proceedings Article | 4 October 2011 Paper

Online re-optimization as a powerful part of enhanced strategies in optical broadband monitoring

S. Schlichting, K. Heinrich, H. Ehlers, D. Ristau

Proceedings Volume 8168, 81681E (2011) https://doi.org/10.1117/12.898557

KEYWORDS: Coating, Transmittance, Computer simulations, Multilayers, Detection and tracking algorithms, Algorithm development, Virtual reality, Process control, Optics manufacturing, Titanium dioxide

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Proceedings Article | 4 October 2011 Paper

From independent thickness monitoring to adaptive manufacturing: advanced deposition control of complex optical coatings

Henrik Ehlers, Sebastian Schlichting, Carsten Schmitz, Detlev Ristau

Proceedings Volume 8168, 81681F (2011) https://doi.org/10.1117/12.898598

KEYWORDS: Optics manufacturing, Crystals, Manufacturing, Transmittance, Quartz, Crystal optics, Coating, Optical coatings, Process control, Titanium dioxide

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Proceedings Article | 25 September 2008 Paper

Optimization and characterization of transparent photocatalytic TiO2 thin films prepared by ion-assisted deposition

Redouan Boughaled, Sebastian Schlichting, Henrik Ehlers, Detlev Ristau, Inga Bannat, Michael Wark

Proceedings Volume 7101, 71010K (2008) https://doi.org/10.1117/12.797719

KEYWORDS: Ions, Thin films, Optical coatings, Ultraviolet radiation, Thin film coatings, Crystals, Oxygen, Image processing, Deposition processes, Titanium dioxide

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Proceedings Article | 25 September 2008 Paper

State of the art in deterministic production of optical thin films

D. Ristau, H. Ehlers, S. Schlichting, M. Lappschies

Proceedings Volume 7101, 71010C (2008) https://doi.org/10.1117/12.797264

KEYWORDS: Optical coatings, Deposition processes, Optical filters, Crystals, Control systems, Refractive index, Switching, Sputter deposition, Quartz, Detection and tracking algorithms

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Showing 5 of 8 publications

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