Mr. Shishir Gauchan Profile

Shishir Gauchan

at Bremer Institute für angewandte Strahltechnik GmbH

SPIE Involvement:

Author

Area of Expertise:

optical 3D metrology , generic camera calibration , structured light , bundle adjustment

Websites:

Company Website

Publications (1)

Proceedings Article | 20 June 2021 Poster + Presentation + Paper

Shishir Gauchan, Jonas Bartsch, Ralf Bergmann

Proceedings Volume 11787, 117870H (2021) https://doi.org/10.1117/12.2592296

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